• 602 Citations
  • 13 h-Index
1993 …2019
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Projects 2013 2018

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Advanced focused ion beam microscope with secondary ion mass spectrometer for trace element characterisation and nanomachining of hard and soft matter

Lang, C., Pereloma, E., Forsyth, M., Ivanova, E., Donne, S., Ye, L., Dou, S., Fu, J., Sheppard, L., Crosky, A., Birbilis, N., Nutman, A., Tieu, K., Nolan, D. & Gazder, A.

10/06/1631/12/16

Project: Research

Micron Scale Precision Probe Station

Zakoshanski, I., Heimlich, M., Downes, J., Jackson, S., Inglis, D. & Lang, C.

4/02/1531/12/15

Project: Research

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