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Dive into the research topics where Fredo Chavez is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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A neural network-based manufacturing variability modeling of GaN HEMTs
Chavez, F., Bavi, D., Miller, N. C. & Khandelwal, S., 2024, 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS): conference proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 4 p. 8.3Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review
3 Link opens in a new tab Citations (Scopus) -
A single neural network global I-V and C-V parameter extractor for BSIM-CMG compact model
Chen, J.-H., Chavez, F., Tung, C.-T., Khandelwal, S. & Hu, C., Jun 2024, In: Solid-State Electronics. 216, p. 1-7 7 p., 108898.Research output: Contribution to journal › Article › peer-review
15 Link opens in a new tab Citations (Scopus) -
Machine learning-based large-signal parameter extraction for ASM-HEMT
Chavez, F. & Khandelwal, S., Feb 2024, In: IEEE Microwave and Wireless Technology Letters. 34, 2, p. 147-150 4 p.Research output: Contribution to journal › Article › peer-review
7 Link opens in a new tab Citations (Scopus) -
Deep learning-based ASM-HEMT high frequency parameter extraction
Chavez, F. & Khandelwal, S., 2023, 2023 IEEE Wireless and Microwave Technology Conference (WAMICON). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), p. 41-44 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review
6 Link opens in a new tab Citations (Scopus) -
Deep learning-based I-V global parameter extraction for BSIM-CMG
Chavez, F., Tung, C.-T., Kao, M.-Y., Hu, C., Chen, J.-H. & Khandelwal, S., Nov 2023, In: Solid-State Electronics. 209, p. 1-5 5 p., 108766.Research output: Contribution to journal › Article › peer-review
Open AccessFile18 Link opens in a new tab Citations (Scopus)570 Downloads (Pure)