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Dive into the research topics where Sourabh Khandelwal is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Projects
- 3 Finished
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Investigation of GaN-HEMT model as ASM-HEMT model for SEI GaN-HEMT which represents transient response and IMD behavior
Khandelwal, S. & Yamamoto, H.
1/11/21 → 30/04/23
Project: Research
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MQSN 21: The Philosopher's Stone of Microwave Transistor Modelling - Extrapolation
Heimlich, M., Khandelwal, S. & Parker, A.
30/08/21 → 30/11/21
Project: Research
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A neural network-based manufacturing variability modeling of GaN HEMTs
Chavez, F., Bavi, D., Miller, N. C. & Khandelwal, S., 2024, 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS): conference proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 4 p. 8.3Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review
3 Citations (Scopus) -
A single neural network global I-V and C-V parameter extractor for BSIM-CMG compact model
Chen, J-H., Chavez, F., Tung, C-T., Khandelwal, S. & Hu, C., Jun 2024, In: Solid-State Electronics. 216, p. 1-7 7 p., 108898.Research output: Contribution to journal › Article › peer-review
6 Citations (Scopus) -
Compact modeling of power GaN Fin-JFETs I-V characteristics using ASM-HEMT model
Bavi, D. & Khandelwal, S., 2024, 2024 IEEE Texas Power and Energy Conference (TPEC). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), p. 1-5 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review
1 Citation (Scopus) -
Fast, scalable, and highly accurate thermal modeling for use in GaN/GaAs RF circuit modeling platforms
Drandova, G., Jimenez, J., Wisch, J., Khandelwal, S. & Ashby, K., 2024, 2024 IEEE International Reliability Physics Symposium (IRPS): proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution
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Machine learning-based large-signal parameter extraction for ASM-HEMT
Chavez, F. & Khandelwal, S., Feb 2024, In: IEEE Microwave and Wireless Technology Letters. 34, 2, p. 147-150 4 p.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus)
Impacts
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ASM-HEMT Compact Model for GaN RF and Power Devices
Sourabh Khandelwal (Participant)
Impact: Technology impacts