Research Output per year
Fingerprint Dive into the research topics where Sourabh Khandelwal is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 7 Similar Profiles
High electron mobility transistors
Engineering & Materials Science
Surface potential
Engineering & Materials Science
Capacitance
Engineering & Materials Science
Transistors
Engineering & Materials Science
Physics
Engineering & Materials Science
Drain current
Engineering & Materials Science
Electric potential
Engineering & Materials Science
Field effect transistors
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Outputs 2007 2019
Analog neuromorphic system based on multi input floating gate MOS neuron model
Tripathi, A., Arabizadeh, M., Khandelwal, S. & Thakur, C. S., 2019, 2019 IEEE International Symposium on Circuits and Systems (ISCAS): proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › Research › peer-review
Neurons
Learning systems
Transistors
Neural networks
Circuit simulation
ASM GaN: industry standard model for GaN RF and power devices - part-II: modeling of charge trapping
Albahrani, S. A., Mahajan, D., Hodges, J., Chauhan, Y. S. & Khandelwal, S., Jan 2019, In : IEEE Transactions on Electron Devices. 66, 1, p. 87-94 8 p.Research output: Contribution to journal › Article › Research › peer-review
Charge trapping
High electron mobility transistors
Industry
Electric potential
Field effect transistors
Design methodology considering evolution of statistical corners under long term degradation
Eslahi, H., Mahajan, D., Albahrani, S. A. & Khandelwal, S., Sep 2019, In : Microelectronics Journal. 91, p. 36-41 6 p.Research output: Contribution to journal › Article › Research › peer-review
methodology
degradation
Degradation
Circuit simulation
Networks (circuits)
Analysis of low-frequency noise characterisation set-up for electronic devices
Hodges, J. T., Heimlich, M. & Khandelwal, S., 2018, 2018 Australian Microwave Symposium (AMS): 6th - 7th February, 2018, Brisbane, Australia: conference proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), p. 39-40 2 p.Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › Research › peer-review
low frequencies
noise measurement
electronics
quantitative analysis
Chemical analysis
ASM-HEMT: industry standard GaN HEMT model for power and RF applications (invited paper)
Ghosh, S., Ahsan, S. A., Khandelwal, S., Pampori, A., Dangi, R. & Chauhan, Y. S., 13 May 2018, TechConnect briefs 2018: informatics, electronics and microsystems. Laudon, M. & Romanowicz, B. (eds.). Danville: TechConnect, Vol. 4. p. 236-239 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › Research › peer-review
Open Access
SPICE
High electron mobility transistors
Industry
Surface potential
Two dimensional electron gas