Advanced focused ion beam microscope with secondary ion mass spectrometer for trace element characterisation and nanomachining of hard and soft matter

  • Lang, Candace (Primary Chief Investigator)
  • Pereloma, Elena (Chief Investigator)
  • Forsyth, Maria (Chief Investigator)
  • Ivanova, Elena (Chief Investigator)
  • Donne, Scott (Chief Investigator)
  • Ye, Lin (Chief Investigator)
  • Dou, Shi (Chief Investigator)
  • Fu, Jing (Chief Investigator)
  • Sheppard, Leigh (Chief Investigator)
  • Crosky, Alan (Chief Investigator)
  • Birbilis, Nick (Chief Investigator)
  • Nutman, Allen (Chief Investigator)
  • Tieu, Kiet (Chief Investigator)
  • Nolan, David (Partner Investigator)
  • Gazder, Azdiar (Chief Investigator)

Project: Research

Project Details

Effective start/end date10/06/1631/12/16