Advanced focused ion beam microscope with secondary ion mass spectrometer for trace element characterisation and nanomachining of hard and soft matter
- Lang, Candace (Primary Chief Investigator)
- Pereloma, Elena (Chief Investigator)
- Forsyth, Maria (Chief Investigator)
- Ivanova, Elena (Chief Investigator)
- Donne, Scott (Chief Investigator)
- Ye, Lin (Chief Investigator)
- Dou, Shi (Chief Investigator)
- Fu, Jing (Chief Investigator)
- Sheppard, Leigh (Chief Investigator)
- Crosky, Alan (Chief Investigator)
- Birbilis, Nick (Chief Investigator)
- Nutman, Allen (Chief Investigator)
- Tieu, Kiet (Chief Investigator)
- Nolan, David (Partner Investigator)
- Gazder, Azdiar (Chief Investigator)
Project: Research