劣化予測プログラム、劣化予測方法、および劣化予測装置: JP 7119882 B2

Translated title of the contribution: Deterioration prediction program, deterioration prediction method, and deterioration prediction device

木幡 駿 (Inventor), 齊藤 孝広 (Inventor), 伊海 佳昭 (Inventor)

Research output: Patent

Abstract

PROBLEM TO BE SOLVED: To improve accuracy in predicting deterioration of a battery.

SOLUTION: An information processing device 100 acquires time sequential data indicating temporal changes of battery deterioration amounts of a terminal device A and a terminal device B. The information processing device 100 generates models 101, 102 or the like concerning the terminal device A and generates models 103, 104 or the like concerning the terminal device B. The information processing device 100 generates one or more patterns where a use form 1 is associated with a use form 2, for each line segment included in straight lines or polygonal lines indicated by the models 101-104 or the like. The information processing device 100 generates combinations 111-114 or the like by combining the patterns. The information processing device 100 predicts deterioration of a battery for each terminal device based on a dispersion of inclinations of line segments for each use form in the respective combinations such as the combinations 111-114 or the like.
Translated title of the contributionDeterioration prediction program, deterioration prediction method, and deterioration prediction device
Original languageJapanese
Patent numberJP 7119882 B2
IPCG01R 31/36,H01M 10/48
Filing date15/10/18
Publication statusPublished - 17 Aug 2022
Externally publishedYes

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