Abstract
An accurate non-linear large-signal physics-based model for 50 V GaN HEMT technology is presented in this paper. The developed model accounts for the effects of trapping on I-V and C-V characteristics of GaN HEMTs self-consistently. Using the developed model we show the significance of self-consistent modeling of I-V and C-V behavior of the device on its large signal performance in presence of trapping. The computational speed of the developed physics-based model is also presented showing its aptness for use in circuit simulations.
Original language | English |
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Title of host publication | 2021 16th European Microwave Integrated Circuits Conference proceedings |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 13-16 |
Number of pages | 4 |
ISBN (Electronic) | 9782874870644 |
ISBN (Print) | 9781665447225 |
DOIs | |
Publication status | Published - 2021 |
Event | 16th European Microwave Integrated Circuits Conference, EuMIC 2021 - London, United Kingdom Duration: 3 Apr 2022 → 4 Apr 2022 |
Conference
Conference | 16th European Microwave Integrated Circuits Conference, EuMIC 2021 |
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Country/Territory | United Kingdom |
City | London |
Period | 3/04/22 → 4/04/22 |
Keywords
- GaN HEMTs
- Compact models
- Large signal
- RF PAs
- Physics-based compact models