A modified software reliability modeling with compounded-decreased-rate

Qing-Rui Zhang, Hou-Ying Zhu, Yu-Bo Yuan

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

In order to describe the complexity of software product and development processes, software reliability models need to possess the ability of dealing with multiple parameters, robustness and flexibility. In this paper, based on the principles above, with the compounded rate of removed errors, we derive a powerful, easily deployable technique for software reliability modeling in the testing phases. By comparing with Yuan's model, our model is more adequate in predicting and fits to the real situation in the long run. Moreover, when we collect enough historical failure data of software, prediction results will be fairly accurate.
Original languageEnglish
Title of host publicationProceedings of 2012 International Conference on Machine Learning and Cybernetics
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1523-1529
Number of pages7
Volume5
ISBN (Electronic)9781467314879, 9781467314862
ISBN (Print)9781467314848
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event2012 International Conference on Machine Learning and Cybernetics - Shaanxi, China
Duration: 15 Jul 201217 Jul 2012

Publication series

Name
ISSN (Print)2160-133X
ISSN (Electronic)2160-1348

Conference

Conference2012 International Conference on Machine Learning and Cybernetics
Abbreviated titleICMLC
CountryChina
CityShaanxi
Period15/07/1217/07/12

Keywords

  • Software reliability
  • Compounded decreased-rate
  • Least square
  • First-order differential
  • Average relative error

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