A modified software reliability modeling with compounded-decreased-rate

Qing-Rui Zhang; Hou-Ying Zhu; Yu-Bo Yuan

doi:10.1109/ICMLC.2012.6359591

A modified software reliability modeling with compounded-decreased-rate

Qing-Rui Zhang, Hou-Ying Zhu, Yu-Bo Yuan

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

In order to describe the complexity of software product and development processes, software reliability models need to possess the ability of dealing with multiple parameters, robustness and flexibility. In this paper, based on the principles above, with the compounded rate of removed errors, we derive a powerful, easily deployable technique for software reliability modeling in the testing phases. By comparing with Yuan's model, our model is more adequate in predicting and fits to the real situation in the long run. Moreover, when we collect enough historical failure data of software, prediction results will be fairly accurate.

Original language	English
Title of host publication	Proceedings of 2012 International Conference on Machine Learning and Cybernetics
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1523-1529
Number of pages	7
Volume	5
ISBN (Electronic)	9781467314879, 9781467314862
ISBN (Print)	9781467314848
DOIs	https://doi.org/10.1109/ICMLC.2012.6359591
Publication status	Published - 2012
Externally published	Yes
Event	2012 International Conference on Machine Learning and Cybernetics - Shaanxi, China Duration: 15 Jul 2012 → 17 Jul 2012

Publication series

Name
ISSN (Print)	2160-133X
ISSN (Electronic)	2160-1348

Conference

Conference	2012 International Conference on Machine Learning and Cybernetics
Abbreviated title	ICMLC
Country/Territory	China
City	Shaanxi
Period	15/07/12 → 17/07/12

Keywords

Software reliability
Compounded decreased-rate
Least square
First-order differential
Average relative error

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10.1109/ICMLC.2012.6359591

Cite this

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title = "A modified software reliability modeling with compounded-decreased-rate",

abstract = "In order to describe the complexity of software product and development processes, software reliability models need to possess the ability of dealing with multiple parameters, robustness and flexibility. In this paper, based on the principles above, with the compounded rate of removed errors, we derive a powerful, easily deployable technique for software reliability modeling in the testing phases. By comparing with Yuan's model, our model is more adequate in predicting and fits to the real situation in the long run. Moreover, when we collect enough historical failure data of software, prediction results will be fairly accurate.",

keywords = "Software reliability, Compounded decreased-rate, Least square, First-order differential, Average relative error",

author = "Qing-Rui Zhang and Hou-Ying Zhu and Yu-Bo Yuan",

year = "2012",

doi = "10.1109/ICMLC.2012.6359591",

language = "English",

isbn = "9781467314848",

volume = "5",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

pages = "1523--1529",

booktitle = "Proceedings of 2012 International Conference on Machine Learning and Cybernetics",

address = "United States",

note = "2012 International Conference on Machine Learning and Cybernetics, ICMLC ; Conference date: 15-07-2012 Through 17-07-2012",

}

Zhang, Q-R, Zhu, H-Y & Yuan, Y-B 2012, A modified software reliability modeling with compounded-decreased-rate. in Proceedings of 2012 International Conference on Machine Learning and Cybernetics. vol. 5, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 1523-1529, 2012 International Conference on Machine Learning and Cybernetics, Shaanxi, China, 15/07/12. https://doi.org/10.1109/ICMLC.2012.6359591

A modified software reliability modeling with compounded-decreased-rate. / Zhang, Qing-Rui; Zhu, Hou-Ying; Yuan, Yu-Bo.
Proceedings of 2012 International Conference on Machine Learning and Cybernetics. Vol. 5 Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2012. p. 1523-1529.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - A modified software reliability modeling with compounded-decreased-rate

AU - Zhang, Qing-Rui

AU - Zhu, Hou-Ying

AU - Yuan, Yu-Bo

PY - 2012

Y1 - 2012

N2 - In order to describe the complexity of software product and development processes, software reliability models need to possess the ability of dealing with multiple parameters, robustness and flexibility. In this paper, based on the principles above, with the compounded rate of removed errors, we derive a powerful, easily deployable technique for software reliability modeling in the testing phases. By comparing with Yuan's model, our model is more adequate in predicting and fits to the real situation in the long run. Moreover, when we collect enough historical failure data of software, prediction results will be fairly accurate.

AB - In order to describe the complexity of software product and development processes, software reliability models need to possess the ability of dealing with multiple parameters, robustness and flexibility. In this paper, based on the principles above, with the compounded rate of removed errors, we derive a powerful, easily deployable technique for software reliability modeling in the testing phases. By comparing with Yuan's model, our model is more adequate in predicting and fits to the real situation in the long run. Moreover, when we collect enough historical failure data of software, prediction results will be fairly accurate.

KW - Software reliability

KW - Compounded decreased-rate

KW - Least square

KW - First-order differential

KW - Average relative error

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U2 - 10.1109/ICMLC.2012.6359591

DO - 10.1109/ICMLC.2012.6359591

M3 - Conference proceeding contribution

SN - 9781467314848

VL - 5

SP - 1523

EP - 1529

BT - Proceedings of 2012 International Conference on Machine Learning and Cybernetics

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2012 International Conference on Machine Learning and Cybernetics

Y2 - 15 July 2012 through 17 July 2012

ER -

A modified software reliability modeling with compounded-decreased-rate

Abstract

Publication series

Conference

Keywords

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