Abstract
Full-wave de-embedding refers to a network de-embedding technique in which the fixture effects are removed by characterizing any connection interface using a full-wave EM simulation method instead of by measurement alone. This technique is able to achieve consistent definition of equivalent circuit voltage and current when the de-embedded results are used for EM/circuit cosimulation. Adopting this approach, we describe an improved full-wave de-embedding method for characterizing one-port devices, where multiple redundant fixtures with mutually complementary properties are used to minimize the effects of random errors. Based on a linearized error model, the proposed method is able to improve the de-embedding accuracy over a broad frequency range, particularly when the device under test is reconfigurable. The proposed method is verified through the de-embedding of a surface-mount p-i-n diode, for which numerical and experimental results are provided. We also compare our technique with the thru-reflect-line method, and the results show that full-wave de-embedding can be more reliable in developing device models for accurate EM/circuit cosimulation purposes.
Original language | English |
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Pages (from-to) | 3894-3910 |
Number of pages | 17 |
Journal | IEEE Transactions on Microwave Theory and Techniques |
Volume | 64 |
Issue number | 11 |
DOIs | |
Publication status | Published - Nov 2016 |
Keywords
- EM/circuit cosimulation
- error analysis
- full-wave de-embedding
- multifixture