A multifixture full-wave de-embedding method for characterizing one-port devices

Wenzhi Wang, Ronghong Jin, Trevor S. Bird, Haijun Fan, Xianling Liang, Junping Geng

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Full-wave de-embedding refers to a network de-embedding technique in which the fixture effects are removed by characterizing any connection interface using a full-wave EM simulation method instead of by measurement alone. This technique is able to achieve consistent definition of equivalent circuit voltage and current when the de-embedded results are used for EM/circuit cosimulation. Adopting this approach, we describe an improved full-wave de-embedding method for characterizing one-port devices, where multiple redundant fixtures with mutually complementary properties are used to minimize the effects of random errors. Based on a linearized error model, the proposed method is able to improve the de-embedding accuracy over a broad frequency range, particularly when the device under test is reconfigurable. The proposed method is verified through the de-embedding of a surface-mount p-i-n diode, for which numerical and experimental results are provided. We also compare our technique with the thru-reflect-line method, and the results show that full-wave de-embedding can be more reliable in developing device models for accurate EM/circuit cosimulation purposes.
Original languageEnglish
Pages (from-to)3894-3910
Number of pages17
JournalIEEE Transactions on Microwave Theory and Techniques
Volume64
Issue number11
DOIs
Publication statusPublished - Nov 2016

Keywords

  • EM/circuit cosimulation
  • error analysis
  • full-wave de-embedding
  • multifixture

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