Full-wave de-embedding refers to a network de-embedding technique in which the fixture effects are removed by characterizing any connection interface using a full-wave EM simulation method instead of by measurement alone. This technique is able to achieve consistent definition of equivalent circuit voltage and current when the de-embedded results are used for EM/circuit cosimulation. Adopting this approach, we describe an improved full-wave de-embedding method for characterizing one-port devices, where multiple redundant fixtures with mutually complementary properties are used to minimize the effects of random errors. Based on a linearized error model, the proposed method is able to improve the de-embedding accuracy over a broad frequency range, particularly when the device under test is reconfigurable. The proposed method is verified through the de-embedding of a surface-mount p-i-n diode, for which numerical and experimental results are provided. We also compare our technique with the thru-reflect-line method, and the results show that full-wave de-embedding can be more reliable in developing device models for accurate EM/circuit cosimulation purposes.
|Number of pages||17|
|Journal||IEEE Transactions on Microwave Theory and Techniques|
|Publication status||Published - Nov 2016|
- EM/circuit cosimulation
- error analysis
- full-wave de-embedding
Wang, W., Jin, R., Bird, T. S., Fan, H., Liang, X., & Geng, J. (2016). A multifixture full-wave de-embedding method for characterizing one-port devices. IEEE Transactions on Microwave Theory and Techniques, 64(11), 3894-3910. https://doi.org/10.1109/TMTT.2016.2601923