A new approach to modelling the coherence of optical feedback in dynamical semiconductor laser systems

M. Radziunas, D. J. Little, D. M. Kane*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Abstract

It is well known that optical feedback in a laser system, such as the semiconductor laser-based one shown schematically in fig.1, can either stabilise or destabilise its output power and spectral characteristics. Semiconductor lasers have a level of sensitivity to optical feedback that is far greater than most lasers [1-3]. The current interest in using semiconductor laser with optical feedback systems, including versions implemented as integrated devices, in, for example, random number generation, reservoir computing and secure communications [1-3], sustains vigorous research activity in the field. The high, and increasing, potential for making strong connections between the predictions of increasingly sophisticated theoretical models of these complex systems and experimental measurements also reinforces the sustained activity in the field.
Original languageEnglish
Title of host publicationCOMMAD 2018
Subtitle of host publicationConference on Optoelectronic and Microelectronic Materials and Devices
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-3
Number of pages3
ISBN (Electronic)9781538695241
ISBN (Print)9781538695258
DOIs
Publication statusPublished - 2018
Event2018 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2018 - Perth, Australia
Duration: 9 Dec 201813 Dec 2018

Conference

Conference2018 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2018
Country/TerritoryAustralia
CityPerth
Period9/12/1813/12/18

Fingerprint

Dive into the research topics of 'A new approach to modelling the coherence of optical feedback in dynamical semiconductor laser systems'. Together they form a unique fingerprint.

Cite this