A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis

Jonathan B. Scott, Peter S. Blockley, Anthony E. Parker

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Original languageEnglish
Title of host publicationProceedings of the 63rd automatic radio frequency techniques group microwave measurement conference
Subtitle of host publicationdigital communication system metrics
EditorsJ G Burns
Place of PublicationUSA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-5
Number of pages5
Publication statusPublished - 2004
Event63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization - Fort Worth, Texas, America
Duration: 1 Jan 2004 → …

Conference

Conference63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization
CityFort Worth, Texas, America
Period1/01/04 → …

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