A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis

Jonathan B. Scott; Peter S. Blockley; Anthony E. Parker

A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis

Jonathan B. Scott, Peter S. Blockley, Anthony E. Parker

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Original language	English
Title of host publication	Proceedings of the 63rd automatic radio frequency techniques group microwave measurement conference
Subtitle of host publication	digital communication system metrics
Editors	J G Burns
Place of Publication	USA
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1-5
Number of pages	5
Publication status	Published - 2004
Event	63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization - Fort Worth, Texas, America Duration: 1 Jan 2004 → …

Conference

Conference	63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization
City	Fort Worth, Texas, America
Period	1/01/04 → …

Cite this

Scott, Jonathan B. ; Blockley, Peter S. ; Parker, Anthony E. / A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis. Proceedings of the 63rd automatic radio frequency techniques group microwave measurement conference: digital communication system metrics. editor / J G Burns. USA : Institute of Electrical and Electronics Engineers (IEEE), 2004. pp. 1-5

@inproceedings{4144c09401c54cd0b780bfee99f76bd2,

title = "A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis",

author = "Scott, {Jonathan B.} and Blockley, {Peter S.} and Parker, {Anthony E.}",

year = "2004",

language = "English",

pages = "1--5",

editor = "Burns, {J G}",

booktitle = "Proceedings of the 63rd automatic radio frequency techniques group microwave measurement conference",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization ; Conference date: 01-01-2004",

}

Scott, JB, Blockley, PS & Parker, AE 2004, A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis. in JG Burns (ed.), Proceedings of the 63rd automatic radio frequency techniques group microwave measurement conference: digital communication system metrics. Institute of Electrical and Electronics Engineers (IEEE), USA, pp. 1-5, 63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization, Fort Worth, Texas, America, 1/01/04.

A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis. / Scott, Jonathan B.; Blockley, Peter S.; Parker, Anthony E.

Proceedings of the 63rd automatic radio frequency techniques group microwave measurement conference: digital communication system metrics. ed. / J G Burns. USA : Institute of Electrical and Electronics Engineers (IEEE), 2004. p. 1-5.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - A New Instrument Architecture for Millimeter-Wave Time-Domain Signal Analysis

AU - Scott, Jonathan B.

AU - Blockley, Peter S.

AU - Parker, Anthony E.

PY - 2004

Y1 - 2004

M3 - Conference proceeding contribution

SP - 1

EP - 5

BT - Proceedings of the 63rd automatic radio frequency techniques group microwave measurement conference

A2 - Burns, J G

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - USA

T2 - 63rd Automatic Radio Frequency Techniques Group Microwave Measurement Conference: On-Wafer Characterization

Y2 - 1 January 2004

ER -