A new instrument architecture for millimetre-wave time-domain signal analysis

Jonathan B. Scott; Peter S. Blockley; Anthony E. Parker

A new instrument architecture for millimetre-wave time-domain signal analysis

Jonathan B. Scott^*, Peter S. Blockley, Anthony E. Parker

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

20 Citations (Scopus)

Abstract

Current generation sampling oscilloscopes are limited by loss and discontinuity in transmission lines, connectors, and adapters, not the native bandwidth of the sampling gate. We propose a new architecture, method and algorithm that could enable the next generation of time-domain measurement instruments.

Original language	English
Title of host publication	63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	47-51
Number of pages	5
ISBN (Print)	0780383710, 9780780383715
Publication status	Published - 2004
Event	63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization - Fort Worth, TX, United States Duration: 11 Jun 2004 → 11 Jun 2004

Other

Other	63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization
Country/Territory	United States
City	Fort Worth, TX
Period	11/06/04 → 11/06/04

Cite this

@inproceedings{b35f1897d59248a78ae55eac5ba3dbb9,

title = "A new instrument architecture for millimetre-wave time-domain signal analysis",

abstract = "Current generation sampling oscilloscopes are limited by loss and discontinuity in transmission lines, connectors, and adapters, not the native bandwidth of the sampling gate. We propose a new architecture, method and algorithm that could enable the next generation of time-domain measurement instruments.",

author = "Scott, {Jonathan B.} and Blockley, {Peter S.} and Parker, {Anthony E.}",

year = "2004",

language = "English",

isbn = "0780383710",

pages = "47--51",

booktitle = "63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization ; Conference date: 11-06-2004 Through 11-06-2004",

}

Scott, JB, Blockley, PS & Parker, AE 2004, A new instrument architecture for millimetre-wave time-domain signal analysis. in 63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 47-51, 63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization, Fort Worth, TX, United States, 11/06/04.

A new instrument architecture for millimetre-wave time-domain signal analysis. / Scott, Jonathan B.; Blockley, Peter S.; Parker, Anthony E.
63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2004. p. 47-51.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - A new instrument architecture for millimetre-wave time-domain signal analysis

AU - Scott, Jonathan B.

AU - Blockley, Peter S.

AU - Parker, Anthony E.

PY - 2004

Y1 - 2004

N2 - Current generation sampling oscilloscopes are limited by loss and discontinuity in transmission lines, connectors, and adapters, not the native bandwidth of the sampling gate. We propose a new architecture, method and algorithm that could enable the next generation of time-domain measurement instruments.

AB - Current generation sampling oscilloscopes are limited by loss and discontinuity in transmission lines, connectors, and adapters, not the native bandwidth of the sampling gate. We propose a new architecture, method and algorithm that could enable the next generation of time-domain measurement instruments.

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M3 - Conference proceeding contribution

AN - SCOPUS:18844440895

SN - 0780383710

SN - 9780780383715

SP - 47

EP - 51

BT - 63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

Y2 - 11 June 2004 through 11 June 2004

ER -

A new instrument architecture for millimetre-wave time-domain signal analysis

Abstract

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