A new instrument architecture for millimetre-wave time-domain signal analysis

Jonathan B. Scott*, Peter S. Blockley, Anthony E. Parker

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

19 Citations (Scopus)

Abstract

Current generation sampling oscilloscopes are limited by loss and discontinuity in transmission lines, connectors, and adapters, not the native bandwidth of the sampling gate. We propose a new architecture, method and algorithm that could enable the next generation of time-domain measurement instruments.

Original languageEnglish
Title of host publication63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages47-51
Number of pages5
ISBN (Print)0780383710, 9780780383715
Publication statusPublished - 2004
Event63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization - Fort Worth, TX, United States
Duration: 11 Jun 200411 Jun 2004

Other

Other63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization
CountryUnited States
CityFort Worth, TX
Period11/06/0411/06/04

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