A new paradigm to extend diffraction measurements beyond the megabar regime

S. M. Clark; R. Jeanloz

doi:10.1107/S0909049505021084

A new paradigm to extend diffraction measurements beyond the megabar regime

S. M. Clark^*, R. Jeanloz

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.

Original language	English
Pages (from-to)	632-636
Number of pages	5
Journal	Journal of Synchrotron Radiation
Volume	12
Issue number	5
DOIs	https://doi.org/10.1107/S0909049505021084
Publication status	Published - Sep 2005
Externally published	Yes

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title = "A new paradigm to extend diffraction measurements beyond the megabar regime",

abstract = "The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.",

author = "Clark, {S. M.} and R. Jeanloz",

year = "2005",

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A new paradigm to extend diffraction measurements beyond the megabar regime

Abstract

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