A new paradigm to extend diffraction measurements beyond the megabar regime

S. M. Clark; R. Jeanloz

doi:10.1107/S0909049505021084

A new paradigm to extend diffraction measurements beyond the megabar regime

S. M. Clark^*, R. Jeanloz

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.

Original language	English
Pages (from-to)	632-636
Number of pages	5
Journal	Journal of Synchrotron Radiation
Volume	12
Issue number	5
DOIs	https://doi.org/10.1107/S0909049505021084
Publication status	Published - Sept 2005
Externally published	Yes

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@article{e8f0f6e766e647d7a859983f2d132888,

title = "A new paradigm to extend diffraction measurements beyond the megabar regime",

abstract = "The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.",

author = "Clark, {S. M.} and R. Jeanloz",

year = "2005",

month = sep,

doi = "10.1107/S0909049505021084",

language = "English",

volume = "12",

pages = "632--636",

journal = "Journal of Synchrotron Radiation",

issn = "0909-0495",

publisher = "International Union of Crystallography",

number = "5",

}

TY - JOUR

T1 - A new paradigm to extend diffraction measurements beyond the megabar regime

AU - Clark, S. M.

AU - Jeanloz, R.

PY - 2005/9

Y1 - 2005/9

N2 - The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.

AB - The possibility of using X-ray diffraction to precisely monitor crystal structure at the extremes of pressure and temperature produced by shock-wave loading is explored. A summary of the advantages of using various X-ray sources for this work and an outline of the necessary experimental layout is given.

UR - http://www.scopus.com/inward/record.url?scp=27644555108&partnerID=8YFLogxK

U2 - 10.1107/S0909049505021084

DO - 10.1107/S0909049505021084

M3 - Article

C2 - 16120987

AN - SCOPUS:27644555108

SN - 0909-0495

VL - 12

SP - 632

EP - 636

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

IS - 5

ER -

A new paradigm to extend diffraction measurements beyond the megabar regime

Abstract

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