Abstract
A novel energy-dispersive diffractometer has been designed in which diffraction patterns can be collected simultaneously at three angles. This results in a much wider overall coverage of reciprocal space and a matching of the X-ray source and detection system to chosen regions of a pattern so that quantitative analysis is considerably enhanced. We predict a wide acceptance of the technique for in situ studies and multi-phase analysis.
| Original language | English |
|---|---|
| Pages (from-to) | 310-313 |
| Number of pages | 4 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 134 |
| Issue number | 2 |
| Publication status | Published - Feb 1998 |
| Externally published | Yes |