A novel energy-dispersive diffractometer has been designed in which diffraction patterns can be collected simultaneously at three angles. This results in a much wider overall coverage of reciprocal space and a matching of the X-ray source and detection system to chosen regions of a pattern so that quantitative analysis is considerably enhanced. We predict a wide acceptance of the technique for in situ studies and multi-phase analysis.
|Number of pages
|Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
|Published - Feb 1998