A novel planar mesh-type microelectromagnetic sensor - Part I

Model formulation

Subhas Chandra Mukhopadhyay*

*Corresponding author for this work

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

The formulation of analytical model and results for a novel planar mesh-type microelectromagnetic sensor for multiple applications has been reported in this paper. The sensor can be used for the estimation of near-surface properties (such as conductivity, permeability, permittivity, liftoff, etc.) of materials, inspecting the quality of electroplated materials, and has the potential of possible inspection of dairy foods, such as butter, cheese, curds, yogurts, etc. The results obtained from the analytical model for the calculation of the transfer impedance of the sensors has been discussed. The transfer impedance is used for the quality inspection of the system under test in an indirect way.

Original languageEnglish
Pages (from-to)301-307
Number of pages7
JournalIEEE Sensors Journal
Volume4
Issue number3
DOIs
Publication statusPublished - Jun 2004
Externally publishedYes

Keywords

  • Conductivity
  • Meander and mesh configuration
  • Nondestructive evaluation technique
  • Permeability
  • Permittivity
  • Planar-type sensors
  • Transfer impedance

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