A novel X-ray diffractometer to study the texture of materials

C. C. Tang; M. C. Miller; S. M. Clark; M. A. Player; G. R. G. Craib

A novel X-ray diffractometer to study the texture of materials

C. C. Tang^*, M. C. Miller, S. M. Clark, M. A. Player, G. R. G. Craib

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.

Original language	English
Pages (from-to)	6-13
Number of pages	8
Journal	Journal of Synchrotron Radiation
Volume	3
Issue number	1
Publication status	Published - 1 Jan 1996
Externally published	Yes

Cite this

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title = "A novel X-ray diffractometer to study the texture of materials",

abstract = "An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.",

author = "Tang, {C. C.} and Miller, {M. C.} and Clark, {S. M.} and Player, {M. A.} and Craib, {G. R. G.}",

year = "1996",

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AU - Tang, C. C.

AU - Miller, M. C.

AU - Clark, S. M.

AU - Player, M. A.

AU - Craib, G. R. G.

PY - 1996/1/1

Y1 - 1996/1/1

N2 - An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.

AB - An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron radiation has been developed. The design and commissioning of the diffraction instrument are described. The technique was first applied to study a drawn-wire aluminium sample which has a well known deformation texture. To demonstrate its capability further, results obtained from an erbium evaporated thin film are also presented.

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M3 - Article

C2 - 16702652

AN - SCOPUS:0030518875

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VL - 3

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EP - 13

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

IS - 1

ER -

A novel X-ray diffractometer to study the texture of materials

Abstract

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