A surface-potential-based compact model for study of non-linearities in AlGaAs/GaAs HEMTs

Sourabh Khandelwal*, Tor A. Fjeldly

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

5 Citations (Scopus)

Abstract

We present a continuous surface-potential- based electro-thermal compact model suitable for the study of intermodulation distortion IMD in GaAs HEMT devices. We have developed a precise analytical calculation for the position of the Fermi level Ef in these devices from a consistent solution of Schrödinger's and Poisson's equations. The accuracy of our calculation is of the order of pico-volts. Ef is used to define the surface-potential ψ and subsequently derive the drain current Id. We use the developed Id model for prediction of IMD in these devices using Volterra series method. The model is in excellent agreement with experimental IMD data. The impact of various real device effects like self- heating, mobility degradation etc., on the non- linear behavior of the device is analyzed using the model.

Original languageEnglish
Title of host publication2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
Subtitle of host publicationTechnical Digest 2012
Place of PublicationPiscataway, New Jersey
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-4
Number of pages4
ISBN (Print)9781467309295
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event2012 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2012 - La Jolla, CA, United States
Duration: 14 Oct 201217 Oct 2012

Other

Other2012 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2012
CountryUnited States
CityLa Jolla, CA
Period14/10/1217/10/12

Keywords

  • AlGaAs/GaAs HEMTs
  • Compact models
  • Intermodulation distortion

Fingerprint Dive into the research topics of 'A surface-potential-based compact model for study of non-linearities in AlGaAs/GaAs HEMTs'. Together they form a unique fingerprint.

Cite this