A narrow size distribution of quantum dots (QDs) is needed for their application in photovoltaics but collection of such information is difficult. This paper demonstrates the application of Raman spectroscopy as a characterisation tool to extract the size distribution and crystalline fraction of Si QD samples fabricated through the sputter-anneal method. Measured Raman spectra of Si QD materials are de-convoluted into four components according to their origins and Raman scattering by Si QD cores is described by a modified one phonon confinement model, while other components are reproduced with Gaussian functions. Through fitting of Raman spectra, Si QD size distributions and Si crystalline fractions are obtained. The results are compared with the values extracted from PL modelling on a series of B doped Si QD samples. The good consistency between the values extracted by these two methods confirms the validity of the Raman model. The result confirms that Si crystallization has been suppressed by B doping as the average Si QD size and Si crystalline fraction are reduced with increased B doping level.