Accurate determination of the size distribution of Si nanocrystals from PL spectra

Xuguang Jia*, Pengfei Zhang, Ziyun Lin, Rebecca Anthony, Uwe Kortshagen, Shujuan Huang, Binesh Puthen-Veettil, Gavin Conibeer, Ivan Perez-Wurfl

*Corresponding author for this work

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Narrow size distribution of quantum dots (QDs) is needed for their application in photovoltaics but collection of such information is difficult. Many experiments have shown the photoluminescence (PL) spectrum of Si QDs will broaden and peak position is size dependent. However, there is still lack of quantitative analysis of such phenomenon. In this paper, a model is developed to fit the PL spectrum based on spontaneous emission and the size distribution of the QDs. With this model, we can quantitatively analyse the QD size and its distribution using the PL spectra only, saving the need of time consuming and destructive characterization methods such as transmission electron microscopy (TEM). The optical bandgap can be extracted naturally from this PL model. The size and distribution of the QD which are obtained by fitting the PL spectra are then confirmed by measurements using TEM and XRD.

Original languageEnglish
Pages (from-to)55119-55125
Number of pages7
JournalRSC Advances
Volume5
Issue number68
DOIs
Publication statusPublished - 2015
Externally publishedYes

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    Jia, X., Zhang, P., Lin, Z., Anthony, R., Kortshagen, U., Huang, S., ... Perez-Wurfl, I. (2015). Accurate determination of the size distribution of Si nanocrystals from PL spectra. RSC Advances, 5(68), 55119-55125. https://doi.org/10.1039/c5ra02805a