TY - JOUR
T1 - Active switching devices in a tunable EBG structure
T2 - Placement strategies and modelling
AU - Thalakotuna, D.
AU - Matekovits, L.
AU - Heimlich, M.
AU - Esselle, K. P.
AU - Hay, S. G.
PY - 2011
Y1 - 2011
N2 - Different placement strategies for Field-Effect-Transistor (FET) active switching devices in an electromagnetic band gap (EBG) periodic structure are investigated. Two possible placements for the switches are considered: (a) switches on top of a substrate and (b) switches at the ground-plane level. Their advantages and drawbacks are analyzed and discussed in relation to fabrication, extension to 2-D and ground plane design. The transmission results and band gaps of the EBG structure are presented for both switch placements. When determining the transmission of the structure, the FET switches are modeled in two different ways, first as an ideal conductor and then using a more accurate model consisting of embedded scattering parameters. Significant differences have been observed between the results predicted using simple and accurate models. Experimental characterization of the switch reveals technological issues related to their biasing.
AB - Different placement strategies for Field-Effect-Transistor (FET) active switching devices in an electromagnetic band gap (EBG) periodic structure are investigated. Two possible placements for the switches are considered: (a) switches on top of a substrate and (b) switches at the ground-plane level. Their advantages and drawbacks are analyzed and discussed in relation to fabrication, extension to 2-D and ground plane design. The transmission results and band gaps of the EBG structure are presented for both switch placements. When determining the transmission of the structure, the FET switches are modeled in two different ways, first as an ideal conductor and then using a more accurate model consisting of embedded scattering parameters. Significant differences have been observed between the results predicted using simple and accurate models. Experimental characterization of the switch reveals technological issues related to their biasing.
UR - http://www.scopus.com/inward/record.url?scp=80052336104&partnerID=8YFLogxK
U2 - 10.1163/156939311797164873
DO - 10.1163/156939311797164873
M3 - Article
AN - SCOPUS:80052336104
SN - 0920-5071
VL - 25
SP - 1740
EP - 1751
JO - Journal of Electromagnetic Waves and Applications
JF - Journal of Electromagnetic Waves and Applications
IS - 11-12
ER -