Aggregate path Monte-Carlo method for single electron circuit simulations

Sagda E. K. Osman; Rwan Mahmoud; Sharief F. Babiker

doi:10.1109/ICCNEEE.2015.7381384

Aggregate path Monte-Carlo method for single electron circuit simulations

Sagda E. K. Osman, Rwan Mahmoud, Sharief F. Babiker

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

1 Citation (Scopus)

Abstract

For the simulation of single electronic circuits, the standard Monte Carlo method traces the tunnel events across the nodes of the circuit. This paper presents a Monte-Carlo method based on the analytical distribution of the time between successive tunnel events across the given junction. The method is used to compute the steady state characteristics and the Fano factor. The method is shown to be superior for larger circuits under lower bias conditions.

Original language	English
Title of host publication	2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015
Subtitle of host publication	Proceedings
Editors	Rashid A. Saeed, Rania A. Mokhtar
Place of Publication	United States
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	314-317
Number of pages	4
ISBN (Electronic)	9781467378697
DOIs	https://doi.org/10.1109/ICCNEEE.2015.7381384
Publication status	Published - 2015
Externally published	Yes
Event	1st International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015 - Khartoum, Sudan Duration: 7 Sept 2015 → 9 Sept 2015

Conference

Conference	1st International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015
Country/Territory	Sudan
City	Khartoum
Period	7/09/15 → 9/09/15

Keywords

Fano factor
Monte-Carlo
Path based Monte-Carlo
Single electron tunnelling
tunnel junctions

Access to Document

10.1109/ICCNEEE.2015.7381384

Cite this

Osman, S. E. K., Mahmoud, R., & Babiker, S. F. (2015). Aggregate path Monte-Carlo method for single electron circuit simulations. In R. A. Saeed, & R. A. Mokhtar (Eds.), 2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015: Proceedings (pp. 314-317). Article 7381384 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICCNEEE.2015.7381384

Osman, Sagda E. K. ; Mahmoud, Rwan ; Babiker, Sharief F. / Aggregate path Monte-Carlo method for single electron circuit simulations. 2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015: Proceedings. editor / Rashid A. Saeed ; Rania A. Mokhtar. United States : Institute of Electrical and Electronics Engineers (IEEE), 2015. pp. 314-317

@inproceedings{3a9a0bfb9cef479ea81bab31d38562c0,

title = "Aggregate path Monte-Carlo method for single electron circuit simulations",

abstract = "For the simulation of single electronic circuits, the standard Monte Carlo method traces the tunnel events across the nodes of the circuit. This paper presents a Monte-Carlo method based on the analytical distribution of the time between successive tunnel events across the given junction. The method is used to compute the steady state characteristics and the Fano factor. The method is shown to be superior for larger circuits under lower bias conditions.",

keywords = "Fano factor, Monte-Carlo, Path based Monte-Carlo, Single electron tunnelling, tunnel junctions",

author = "Osman, {Sagda E. K.} and Rwan Mahmoud and Babiker, {Sharief F.}",

year = "2015",

doi = "10.1109/ICCNEEE.2015.7381384",

language = "English",

pages = "314--317",

editor = "Saeed, {Rashid A.} and Mokhtar, {Rania A.}",

booktitle = "2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "1st International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015 ; Conference date: 07-09-2015 Through 09-09-2015",

}

Osman, SEK, Mahmoud, R & Babiker, SF 2015, Aggregate path Monte-Carlo method for single electron circuit simulations. in RA Saeed & RA Mokhtar (eds), 2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015: Proceedings., 7381384, Institute of Electrical and Electronics Engineers (IEEE), United States, pp. 314-317, 1st International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015, Khartoum, Sudan, 7/09/15. https://doi.org/10.1109/ICCNEEE.2015.7381384

Aggregate path Monte-Carlo method for single electron circuit simulations. / Osman, Sagda E. K.; Mahmoud, Rwan; Babiker, Sharief F.
2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015: Proceedings. ed. / Rashid A. Saeed; Rania A. Mokhtar. United States: Institute of Electrical and Electronics Engineers (IEEE), 2015. p. 314-317 7381384.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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T1 - Aggregate path Monte-Carlo method for single electron circuit simulations

AU - Osman, Sagda E. K.

AU - Mahmoud, Rwan

AU - Babiker, Sharief F.

PY - 2015

Y1 - 2015

N2 - For the simulation of single electronic circuits, the standard Monte Carlo method traces the tunnel events across the nodes of the circuit. This paper presents a Monte-Carlo method based on the analytical distribution of the time between successive tunnel events across the given junction. The method is used to compute the steady state characteristics and the Fano factor. The method is shown to be superior for larger circuits under lower bias conditions.

AB - For the simulation of single electronic circuits, the standard Monte Carlo method traces the tunnel events across the nodes of the circuit. This paper presents a Monte-Carlo method based on the analytical distribution of the time between successive tunnel events across the given junction. The method is used to compute the steady state characteristics and the Fano factor. The method is shown to be superior for larger circuits under lower bias conditions.

KW - Fano factor

KW - Monte-Carlo

KW - Path based Monte-Carlo

KW - Single electron tunnelling

KW - tunnel junctions

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DO - 10.1109/ICCNEEE.2015.7381384

M3 - Conference proceeding contribution

AN - SCOPUS:84965175055

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EP - 317

BT - 2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015

A2 - Saeed, Rashid A.

A2 - Mokhtar, Rania A.

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - United States

T2 - 1st International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015

Y2 - 7 September 2015 through 9 September 2015

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Osman SEK, Mahmoud R, Babiker SF. Aggregate path Monte-Carlo method for single electron circuit simulations. In Saeed RA, Mokhtar RA, editors, 2015 International Conference on Computing, Control, Networking, Electronics and Embedded Systems Engineering, ICCNEEE 2015: Proceedings. United States: Institute of Electrical and Electronics Engineers (IEEE). 2015. p. 314-317. 7381384 doi: 10.1109/ICCNEEE.2015.7381384

Aggregate path Monte-Carlo method for single electron circuit simulations

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