All-optical self-referenced transverse position sensing with sub-nanometer precision

Nora Tischler, Johannes Stark, Xavier Zambrana Puyalto, Ivan Fernandez-Corbaton, Xavier Vidal Asensio, Gabriel Molina-Terriza, Mathieu J. Juan

Research output: Contribution to journalArticle

3 Citations (Scopus)


The emergence of technologies operating at the nanometer scale for applications as varied as nano-fabrication and super-resolution microscopy has driven the need for ever more accurate spatial localization. In this context, nano-structures have been used as probes in order to provide a reference to track lateral drifts in the system. Yet nanometer precision remains challenging and usually involves complicated measurement apparatus. In this work we report a simple method based on symmetry considerations to measure the position of a sub-wavelength nano-structure. For a particular choice of structures, gold nano-particles, we demonstrate a sub-nanometer lateral precision of 0.55 nm. The versatility of the method also allows for the use of different structures, offering a promising opportunity for sub-nanometer positioning accuracy for a wide variety of systems.
Original languageEnglish
Pages (from-to)3628–3633
Number of pages6
JournalACS Photonics
Issue number9
Early online date6 Aug 2018
Publication statusPublished - 2018


  • angular momentum
  • helicity
  • nanoparticle
  • position sensing
  • symmetry breaking

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