Alternative approach to precision narrow-angle astrometry for Antarctic long baseline interferometry

Yitping Kok, Michael J. Ireland, Aaron C. Rizzuto, Peter G. Tuthill, J. Gordon Robertson, Benjamin A. Warrington, William J. Tango

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    Abstract

    The conventional approach to high-precision narrow-angle astrometry using a long baseline interferometer is to directly measure the fringe packet separation of a target and a nearby reference star. This is done by means of a technique known as phase-referencing which requires a network of dual beam combiners and laser metrology systems. Using an alternative approach that does not rely on phase-referencing, the narrow-angle astrometry of several closed binary stars (with separation less than 2″), as described in this paper, was carried out by observing the fringe packet crossing event of the binary systems. Such an event occurs twice every sidereal day when the line joining the two stars of the binary is is perpendicular to the projected baseline of the interferometer. Observation of these events is well suited for an interferometer in Antarctica. Proof of concept observations were carried out at the Sydney University Stellar Interferometer (SUSI) with targets selected according to its geographical location. Narrow-angle astrometry using this indirect approach has achieved sub-100 micro-arcsecond precision.

    Original languageEnglish
    Title of host publicationOptical and Infrared Interferometry IV
    EditorsJayadev K. Rajagopal, Michelle J. Creech-Eakman, Fabien Malbet
    Place of PublicationWashington, DC
    PublisherSPIE
    Pages1-17
    Number of pages17
    Volume9146
    ISBN (Electronic)9780819496140
    DOIs
    Publication statusPublished - 2014
    EventOptical and Infrared Interferometry IV - Montreal, Canada
    Duration: 23 Jun 201427 Jun 2014

    Publication series

    NameProceedings of SPIE
    PublisherSPIE
    Volume9146
    ISSN (Print)0277-786X

    Other

    OtherOptical and Infrared Interferometry IV
    CountryCanada
    CityMontreal
    Period23/06/1427/06/14

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