TY - JOUR
T1 - An analytical model for hot carrier induced long-term degradation in power amplifiers
AU - Eslahi, Hossein
AU - Albahrani, Sayed Ali
AU - Mahajan, Dhawal
AU - Khandelwal, Sourabh
PY - 2020/10
Y1 - 2020/10
N2 - Degradation of power amplifier (PA), being a main part of a transceiver chain, affects the overall performance of a transceiver. This article reports, for the first time, an analytical reliability model of the hot-carrier injection (HCI) induced degradation in silicon-based PAs. HCI causes substrate current which is used to develop the proposed model. This model fits very well the simulation results of RelXpert, which is a well-established reliability simulation tool. This model predicts circuit degradation as a function of conduction angle and is valid for the different classes of PAs. With this model, a new approach for 'reliability aware design' for PA design is developed and a tradeoff between PA performance and reliability is introduced.
AB - Degradation of power amplifier (PA), being a main part of a transceiver chain, affects the overall performance of a transceiver. This article reports, for the first time, an analytical reliability model of the hot-carrier injection (HCI) induced degradation in silicon-based PAs. HCI causes substrate current which is used to develop the proposed model. This model fits very well the simulation results of RelXpert, which is a well-established reliability simulation tool. This model predicts circuit degradation as a function of conduction angle and is valid for the different classes of PAs. With this model, a new approach for 'reliability aware design' for PA design is developed and a tradeoff between PA performance and reliability is introduced.
UR - http://www.scopus.com/inward/record.url?scp=85095798433&partnerID=8YFLogxK
U2 - 10.1109/TCAD.2019.2952554
DO - 10.1109/TCAD.2019.2952554
M3 - Article
AN - SCOPUS:85095798433
VL - 39
SP - 2000
EP - 2005
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
SN - 0278-0070
IS - 10
ER -