An electron spectrometer for LEED fine structure measurements

S. Thurgate*, G. Hitchen

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)


    LEED fine structure analysis requires intensity versus energy data for very low energy electrons (typically 5-25 eV) at various angles of incidence and azimuth. An electron spectrometer capable of fulfilling these requirements was built and used to obtain data for Cu(111). This spectrometer differs from others used for these type of measurements in that it used a retarding field analyzer to collect the elastically scattered beams instead of a deflecting analyzer. This considerably simplifies the apparatus required and the experimental procedure as the collector can be used at a fixed angle to collect data from a number of different angles of incidence. The experimental design is discussed and sample results, showing that three peaks were resolved, are presented.

    Original languageEnglish
    Pages (from-to)202-212
    Number of pages11
    JournalApplied Surface Science
    Issue number2
    Publication statusPublished - 1985


    Dive into the research topics of 'An electron spectrometer for LEED fine structure measurements'. Together they form a unique fingerprint.

    Cite this