Analysis of HEMT time-evolution characteristics

Anthony E. Parker; James G. Rathmell

doi:10.1109/EUMA.2001.339139

Analysis of HEMT time-evolution characteristics

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

A novel transient measurement of the time-evolution of drain characteristics is analyzed to separate thermal and trapping dispersions. The procedure extracts isothermal characteristics from the measured data and parameterizes thermal dispersion. A significant dispersion effect in the isothermal characteristics is then linked to leakage currents that are related to drain potential. The effect of impact ionization is also evident in the data. This analysis provides information necessary to formulate bias- and rate-dependent models of HEMTs.

Original language	English
Title of host publication	2001 31st European Microwave Conference, EuMC 2001
Editors	Shmuel Auster, Thomas Brazil, Alain Cappy, Jean-Louis Cazaux, Claudio Massimo, Sylvain Delage, Fabio Filicori, Vincent Foscus, Ghione Giovanni, Franco Giannini, Maurice Gloannec, Hans Hartnagel, Erik Kollberg, Peter Ladbrooke, St Marsh
Place of Publication	Piscataway, N.J.
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1-4
Number of pages	4
DOIs	https://doi.org/10.1109/EUMA.2001.339139
Publication status	Published - Sept 2001
Event	2001 31st European Microwave Conference, EuMC - 2001 - London, United Kingdom Duration: 24 Sept 2001 → 26 Sept 2001

Other

Other	2001 31st European Microwave Conference, EuMC - 2001
Country/Territory	United Kingdom
City	London
Period	24/09/01 → 26/09/01

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10.1109/EUMA.2001.339139

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Parker, A. E., & Rathmell, J. G. (2001). Analysis of HEMT time-evolution characteristics. In S. Auster, T. Brazil, A. Cappy, J.-L. Cazaux, C. Massimo, S. Delage, F. Filicori, V. Foscus, G. Giovanni, F. Giannini, M. Gloannec, H. Hartnagel, E. Kollberg, P. Ladbrooke, & S. Marsh (Eds.), 2001 31st European Microwave Conference, EuMC 2001 (pp. 1-4). Article 4140207 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/EUMA.2001.339139

Parker, Anthony E. ; Rathmell, James G. / Analysis of HEMT time-evolution characteristics. 2001 31st European Microwave Conference, EuMC 2001. editor / Shmuel Auster ; Thomas Brazil ; Alain Cappy ; Jean-Louis Cazaux ; Claudio Massimo ; Sylvain Delage ; Fabio Filicori ; Vincent Foscus ; Ghione Giovanni ; Franco Giannini ; Maurice Gloannec ; Hans Hartnagel ; Erik Kollberg ; Peter Ladbrooke ; St Marsh. Piscataway, N.J. : Institute of Electrical and Electronics Engineers (IEEE), 2001. pp. 1-4

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title = "Analysis of HEMT time-evolution characteristics",

abstract = "A novel transient measurement of the time-evolution of drain characteristics is analyzed to separate thermal and trapping dispersions. The procedure extracts isothermal characteristics from the measured data and parameterizes thermal dispersion. A significant dispersion effect in the isothermal characteristics is then linked to leakage currents that are related to drain potential. The effect of impact ionization is also evident in the data. This analysis provides information necessary to formulate bias- and rate-dependent models of HEMTs.",

author = "Parker, {Anthony E.} and Rathmell, {James G.}",

year = "2001",

month = sep,

doi = "10.1109/EUMA.2001.339139",

language = "English",

pages = "1--4",

editor = "Shmuel Auster and Thomas Brazil and Alain Cappy and Jean-Louis Cazaux and Claudio Massimo and Sylvain Delage and Fabio Filicori and Vincent Foscus and Ghione Giovanni and Franco Giannini and Maurice Gloannec and Hans Hartnagel and Erik Kollberg and Peter Ladbrooke and St Marsh",

booktitle = "2001 31st European Microwave Conference, EuMC 2001",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2001 31st European Microwave Conference, EuMC - 2001 ; Conference date: 24-09-2001 Through 26-09-2001",

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Parker, AE & Rathmell, JG 2001, Analysis of HEMT time-evolution characteristics. in S Auster, T Brazil, A Cappy, J-L Cazaux, C Massimo, S Delage, F Filicori, V Foscus, G Giovanni, F Giannini, M Gloannec, H Hartnagel, E Kollberg, P Ladbrooke & S Marsh (eds), 2001 31st European Microwave Conference, EuMC 2001., 4140207, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, N.J., pp. 1-4, 2001 31st European Microwave Conference, EuMC - 2001, London, United Kingdom, 24/09/01. https://doi.org/10.1109/EUMA.2001.339139

Analysis of HEMT time-evolution characteristics. / Parker, Anthony E.; Rathmell, James G.
2001 31st European Microwave Conference, EuMC 2001. ed. / Shmuel Auster; Thomas Brazil; Alain Cappy; Jean-Louis Cazaux; Claudio Massimo; Sylvain Delage; Fabio Filicori; Vincent Foscus; Ghione Giovanni; Franco Giannini; Maurice Gloannec; Hans Hartnagel; Erik Kollberg; Peter Ladbrooke; St Marsh. Piscataway, N.J.: Institute of Electrical and Electronics Engineers (IEEE), 2001. p. 1-4 4140207.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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AB - A novel transient measurement of the time-evolution of drain characteristics is analyzed to separate thermal and trapping dispersions. The procedure extracts isothermal characteristics from the measured data and parameterizes thermal dispersion. A significant dispersion effect in the isothermal characteristics is then linked to leakage currents that are related to drain potential. The effect of impact ionization is also evident in the data. This analysis provides information necessary to formulate bias- and rate-dependent models of HEMTs.

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BT - 2001 31st European Microwave Conference, EuMC 2001

A2 - Auster, Shmuel

A2 - Brazil, Thomas

A2 - Cappy, Alain

A2 - Cazaux, Jean-Louis

A2 - Massimo, Claudio

A2 - Delage, Sylvain

A2 - Filicori, Fabio

A2 - Foscus, Vincent

A2 - Giovanni, Ghione

A2 - Giannini, Franco

A2 - Gloannec, Maurice

A2 - Hartnagel, Hans

A2 - Kollberg, Erik

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PB - Institute of Electrical and Electronics Engineers (IEEE)

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Parker AE, Rathmell JG. Analysis of HEMT time-evolution characteristics. In Auster S, Brazil T, Cappy A, Cazaux JL, Massimo C, Delage S, Filicori F, Foscus V, Giovanni G, Giannini F, Gloannec M, Hartnagel H, Kollberg E, Ladbrooke P, Marsh S, editors, 2001 31st European Microwave Conference, EuMC 2001. Piscataway, N.J.: Institute of Electrical and Electronics Engineers (IEEE). 2001. p. 1-4. 4140207 doi: 10.1109/EUMA.2001.339139

Analysis of HEMT time-evolution characteristics

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