Analysis of low-frequency noise characterisation set-up for electronic devices

Jason T. Hodges*, Michael Heimlich, Sourabh Khandelwal

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

1 Citation (Scopus)

Abstract

In this paper we report an investigation into the low-frequency noise characterisation of electronic devices. Low-frequency noise measurements are complex with several noise sources present in the full measurement set-up. The different noise sources make measurement of the noise signal from the device complicated as noise from sources other than the device need to be suppressed or eliminated. We present a clear quantitative understanding of the noise signals from the various critical components in a typical noise measurement set-up. The quantitative analysis presented here can serve as a guide for accurate noise measurements of electronic devices.

Original languageEnglish
Title of host publication2018 Australian Microwave Symposium (AMS)
Subtitle of host publication6th - 7th February, 2018, Brisbane, Australia: conference proceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages39-40
Number of pages2
ISBN (Electronic)9781538625682, 9781538625675
ISBN (Print)9781538625699
DOIs
Publication statusPublished - 2018
Event2018 Australian Microwave Symposium, AMS 2018 - Brisbane, Australia
Duration: 6 Feb 20187 Feb 2018

Conference

Conference2018 Australian Microwave Symposium, AMS 2018
CountryAustralia
CityBrisbane
Period6/02/187/02/18

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