Analysis of low-frequency noise characterisation set-up for electronic devices

Jason T. Hodges; Michael Heimlich; Sourabh Khandelwal

doi:10.1109/AUSMS.2018.8346971

Analysis of low-frequency noise characterisation set-up for electronic devices

Jason T. Hodges^*, Michael Heimlich, Sourabh Khandelwal

^*Corresponding author for this work

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

1 Citation (Scopus)

Abstract

In this paper we report an investigation into the low-frequency noise characterisation of electronic devices. Low-frequency noise measurements are complex with several noise sources present in the full measurement set-up. The different noise sources make measurement of the noise signal from the device complicated as noise from sources other than the device need to be suppressed or eliminated. We present a clear quantitative understanding of the noise signals from the various critical components in a typical noise measurement set-up. The quantitative analysis presented here can serve as a guide for accurate noise measurements of electronic devices.

Original language	English
Title of host publication	2018 Australian Microwave Symposium (AMS)
Subtitle of host publication	6th - 7th February, 2018, Brisbane, Australia: conference proceedings
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	39-40
Number of pages	2
ISBN (Electronic)	9781538625682, 9781538625675
ISBN (Print)	9781538625699
DOIs	https://doi.org/10.1109/AUSMS.2018.8346971
Publication status	Published - 2018
Event	2018 Australian Microwave Symposium, AMS 2018 - Brisbane, Australia Duration: 6 Feb 2018 → 7 Feb 2018

Conference

Conference	2018 Australian Microwave Symposium, AMS 2018
Country/Territory	Australia
City	Brisbane
Period	6/02/18 → 7/02/18

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10.1109/AUSMS.2018.8346971

Cite this

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title = "Analysis of low-frequency noise characterisation set-up for electronic devices",

abstract = "In this paper we report an investigation into the low-frequency noise characterisation of electronic devices. Low-frequency noise measurements are complex with several noise sources present in the full measurement set-up. The different noise sources make measurement of the noise signal from the device complicated as noise from sources other than the device need to be suppressed or eliminated. We present a clear quantitative understanding of the noise signals from the various critical components in a typical noise measurement set-up. The quantitative analysis presented here can serve as a guide for accurate noise measurements of electronic devices.",

author = "Hodges, \{Jason T.\} and Michael Heimlich and Sourabh Khandelwal",

year = "2018",

doi = "10.1109/AUSMS.2018.8346971",

language = "English",

isbn = "9781538625699",

pages = "39--40",

booktitle = "2018 Australian Microwave Symposium (AMS)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2018 Australian Microwave Symposium, AMS 2018 ; Conference date: 06-02-2018 Through 07-02-2018",

}

Hodges, JT, Heimlich, M & Khandelwal, S 2018, Analysis of low-frequency noise characterisation set-up for electronic devices. in 2018 Australian Microwave Symposium (AMS): 6th - 7th February, 2018, Brisbane, Australia: conference proceedings. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 39-40, 2018 Australian Microwave Symposium, AMS 2018, Brisbane, Australia, 6/02/18. https://doi.org/10.1109/AUSMS.2018.8346971

Analysis of low-frequency noise characterisation set-up for electronic devices. / Hodges, Jason T.; Heimlich, Michael; Khandelwal, Sourabh.
2018 Australian Microwave Symposium (AMS): 6th - 7th February, 2018, Brisbane, Australia: conference proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2018. p. 39-40.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Analysis of low-frequency noise characterisation set-up for electronic devices

AU - Hodges, Jason T.

AU - Heimlich, Michael

AU - Khandelwal, Sourabh

PY - 2018

Y1 - 2018

N2 - In this paper we report an investigation into the low-frequency noise characterisation of electronic devices. Low-frequency noise measurements are complex with several noise sources present in the full measurement set-up. The different noise sources make measurement of the noise signal from the device complicated as noise from sources other than the device need to be suppressed or eliminated. We present a clear quantitative understanding of the noise signals from the various critical components in a typical noise measurement set-up. The quantitative analysis presented here can serve as a guide for accurate noise measurements of electronic devices.

AB - In this paper we report an investigation into the low-frequency noise characterisation of electronic devices. Low-frequency noise measurements are complex with several noise sources present in the full measurement set-up. The different noise sources make measurement of the noise signal from the device complicated as noise from sources other than the device need to be suppressed or eliminated. We present a clear quantitative understanding of the noise signals from the various critical components in a typical noise measurement set-up. The quantitative analysis presented here can serve as a guide for accurate noise measurements of electronic devices.

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U2 - 10.1109/AUSMS.2018.8346971

DO - 10.1109/AUSMS.2018.8346971

M3 - Conference proceeding contribution

AN - SCOPUS:85049744684

SN - 9781538625699

SP - 39

EP - 40

BT - 2018 Australian Microwave Symposium (AMS)

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2018 Australian Microwave Symposium, AMS 2018

Y2 - 6 February 2018 through 7 February 2018

ER -

Analysis of low-frequency noise characterisation set-up for electronic devices

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