Abstract
This paper presents a study of Multilayer Microstrip line of finite conductor thickness using Quasi-Static Spectral Domain Analysis (SDA) method. The finite conductor thickness of the strip is replaced by two parallel strips of zero conductor thickness. The Green's function for the multilayer microstrip line in Fourier domain is obtained by Transverse Transmission Line (TTL) technique. Galerkin's method is applied to find the effective dielectric constant and impedance. Dielectric Loss of multilayer microstrip line is calculated by converting multilayer microstrip line structure into single layer microstrip line using Single Layer Reduction (SLR) method. The Conductor Loss of microstrip line is calculated by Wheeler's incremental inductance method. The effect of finite conductor thickness is also analysed on the impedance, effective relative permittivity, dielectric loss and conductor loss.
| Original language | English |
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| Title of host publication | Proceedings - 2011 Annual IEEE India Conference: Engineering Sustainable Solutions, INDICON-2011 |
| Place of Publication | Piscataway, NJ |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 1-4 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781457711091, 9781457711084 |
| ISBN (Print) | 9781457711107 |
| DOIs | |
| Publication status | Published - 2011 |
| Externally published | Yes |
| Event | 2011 Annual IEEE India Conference: Engineering Sustainable Solutions, INDICON-2011 - Hyderabad, India Duration: 16 Dec 2011 → 18 Dec 2011 |
Other
| Other | 2011 Annual IEEE India Conference: Engineering Sustainable Solutions, INDICON-2011 |
|---|---|
| Country/Territory | India |
| City | Hyderabad |
| Period | 16/12/11 → 18/12/11 |
Keywords
- Conductor Loss
- Dielectric Loss
- Multilayer Microstrip Line
- Quasi-Static Spectral Domain Analysis (SDA)
- Single Layer Reduction (SLR)
- Transverse Transmission Line (TTL)