Analysis of short tandem repeats by using SERS monitoring and electrochemical melting

Damion K. Corrigan, Nittaya Gale, Tom Brown, Philip N. Bartlett*

*Corresponding author for this work

Research output: Contribution to journalArticle

18 Citations (Scopus)
Original languageEnglish
Pages (from-to)5917-5920
Number of pages4
JournalAngewandte Chemie - International Edition
Volume49
Issue number34
DOIs
Publication statusPublished - 2010
Externally publishedYes

Keywords

  • DNA
  • electrochemical melting
  • SERS
  • short tandem repeats

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