Analytical Regularization Method for bodies and screens of revolution with Neumann boundary conditions

Yu A. Tuchkin, E. D. Vinogradova

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

    Abstract

    A detailed explanation of a mathematically rigorous method for numerical simulation of scalar wave diffraction by bodies and infinitely thin screens of revolution is given. The method reduces the diffraction problem to an equivalent system of equations of the second kind that permits numerical solution to be obtained with any predetermined accuracy. The method employs an accumulated set of techniques of the Analytical Regularization Method. The set involves a 'contour closing procedure', proper scaling of the kernel of the corresponding differential-integral equation, Abel integral transforms, techniques of Dual Series Equation involving Jacoby polynomials and Legendre functions, and related ideas.

    Original languageEnglish
    Title of host publicationProceedings of the 2013 International Conference on Electromagnetics in Advanced Applications, ICEAA 2013
    Place of PublicationPiscataway, NJ
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    Pages1485-1488
    Number of pages4
    ISBN (Electronic)9781467357050, 9781467357074
    ISBN (Print)9781467357067
    DOIs
    Publication statusPublished - 2013
    Event2013 15th International Conference on Electromagnetics in Advanced Applications, ICEAA 2013 - Turin, Italy
    Duration: 9 Sep 201313 Sep 2013

    Other

    Other2013 15th International Conference on Electromagnetics in Advanced Applications, ICEAA 2013
    CountryItaly
    CityTurin
    Period9/09/1313/09/13

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  • Cite this

    Tuchkin, Y. A., & Vinogradova, E. D. (2013). Analytical Regularization Method for bodies and screens of revolution with Neumann boundary conditions. In Proceedings of the 2013 International Conference on Electromagnetics in Advanced Applications, ICEAA 2013 (pp. 1485-1488). [6632494] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICEAA.2013.6632494