Annual energy yield analysis of solar cell technology

Malcolm Abbott, Keith McIntosh, Ben Sudbury, Jenya Meydbray, Tsun H. Fung, Muhammad Umair Khan, Yu Zhang, Shuai Zou, Xusheng Wang, Guoqiang Xing, Giuseppe Scardera, David Payne

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

5 Citations (Scopus)


The ultimate value of any photovoltaic technology is the amount of energy it delivers once installed in the field. Gathering this data experimentally can take many years and requires great cost with limited scope to vary the input parameters. Simulations based on detailed lab measurements provide a more cost-effective option to predict the energy yield of a PV technology rapidly. This paper demonstrates the application of highly detailed ray tracing and SPICE modelling to determine the annual energy yield. It compares the simulated performance of different texturing technologies and predicts the losses at a cell, module and system level. Specifically, it studies upright random pyramids, isotexture and two types of MCCE black silicon applied to a Cz bifacial PERC cell. The difference between isotexture and random pyramids was close to 5% at the cell level, however this significantly reduced to less than 2% at a system level indicating that this analysis is critical to properly assess the ultimate value of a technology.

Original languageEnglish
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages5
ISBN (Electronic)9781728104942
ISBN (Print)9781728104959
Publication statusPublished - 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019

Publication series

ISSN (Print)0160-8371


Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States


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