Applications of the HICAM gamma camera

P. Busca*, R. Peloso, C. Fiorini, A. Gola, A. Abba, K. Erlandsson, B. F. Hutton, C. Bianchi, G. L. Poli, U. Guerra, G. Virotta, L. Ottobrini, C. Martelli, G. Lucignani, A. Pedretti, P. Van Mullekom, S. Incorvaia, F. Perotti

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    6 Citations (Scopus)

    Abstract

    The goal of the HICAM project, supported by the European Community, is the development of a new Anger camera for clinical and research environments and specific applications where high overall spatial resolution and system compactness are required. The camera is based on a matrix of Silicon Drift Detectors (SDDs) coupled to a CsI(Tl) crystal. Two prototypes were developed during the project, with 55 cm2 and 1010 cm2 FOV. They provide a high intrinsic spatial resolution (1mm), an overall spatial resolution of ∼ 2.67 mm @ 4cm and appropriate sensitivity. The developed camera is compact, very versatile and has a potential to be employed in several imaging applications, for clinical studies on humans, for small organs imaging in adults and infants, or being incorporated in systems for both planar and SPECT acquisition for small animals studies. In this paper we will describe the most significant results obtained so far with this new camera employed in several applications.

    Original languageEnglish
    Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
    Pages2104-2107
    Number of pages4
    DOIs
    Publication statusPublished - 2010
    Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
    Duration: 30 Oct 20106 Nov 2010

    Other

    Other2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
    CountryUnited States
    CityKnoxville, TN
    Period30/10/106/11/10

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