ASM-ESD - a comprehensive physics-based compact model for ESD Diodes

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

4 Citations (Scopus)

Abstract

This paper presents a new compact model for ESD diodes named Advance SPICE Model for ESD diodes (ASM-ESD). In addition to the current-voltage (I-V) and the capacitance-voltage (C-V) behaviors of the diode under normal operating conditions, ASM-ESD has capabilities to model a plethora of important effects critical for the ESD applications. Model features include the ability to capture the overshoot effects, ambient temperature effects, self-heating effect, post reverse breakdown resistance, parasitic BJT gain, transient behavior of BJT gain and reverse recovery effects in ESD diodes. ASM-ESD model formulations have a physical basis leading to an intuitive extraction flow. Model comparisons with measurements for DC I-V, C-V, and TLP with pulse widths ranging from 200 ns to 1.2 ns are presented. These results demonstrate model accuracy for a full range of ESD event scenarios.

Original languageEnglish
Title of host publication2022 IEEE International Reliability Physics Symposium (IRPS)
Subtitle of host publicationproceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages5C.1-1-5C.1-6
Number of pages6
ISBN (Electronic)9781665479509
ISBN (Print)9781665479516
DOIs
Publication statusPublished - 2022
Event2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Dallas, United States
Duration: 27 Mar 202231 Mar 2022

Publication series

Name
ISSN (Print)1541-7026
ISSN (Electronic)1938-1891

Conference

Conference2022 IEEE International Reliability Physics Symposium, IRPS 2022
Country/TerritoryUnited States
CityDallas
Period27/03/2231/03/22

Keywords

  • ESD diodes
  • ESD modeling
  • SPICE model
  • Compact models

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