@inproceedings{b4ad299fa3aa4bbaa3f2d0756389c4dc,
title = "ASM-ESD - a comprehensive physics-based compact model for ESD Diodes",
abstract = "This paper presents a new compact model for ESD diodes named Advance SPICE Model for ESD diodes (ASM-ESD). In addition to the current-voltage (I-V) and the capacitance-voltage (C-V) behaviors of the diode under normal operating conditions, ASM-ESD has capabilities to model a plethora of important effects critical for the ESD applications. Model features include the ability to capture the overshoot effects, ambient temperature effects, self-heating effect, post reverse breakdown resistance, parasitic BJT gain, transient behavior of BJT gain and reverse recovery effects in ESD diodes. ASM-ESD model formulations have a physical basis leading to an intuitive extraction flow. Model comparisons with measurements for DC I-V, C-V, and TLP with pulse widths ranging from 200 ns to 1.2 ns are presented. These results demonstrate model accuracy for a full range of ESD event scenarios.",
keywords = "ESD diodes, ESD modeling, SPICE model, Compact models",
author = "S. Khandelwal and D. Bavi",
year = "2022",
doi = "10.1109/IRPS48227.2022.9764453",
language = "English",
isbn = "9781665479516",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
pages = "5C.1--1--5C.1--6",
booktitle = "2022 IEEE International Reliability Physics Symposium (IRPS)",
address = "United States",
note = "2022 IEEE International Reliability Physics Symposium, IRPS 2022 ; Conference date: 27-03-2022 Through 31-03-2022",
}