Abstract
This paper examines various statistical distributions in connection with random N x N Vandermonde matrices and their generalization to d-dimensional phase distributions. Upper and lower bound asymptotics for the maximum eigenvalue are found to be O(log N d) and O(log N d/ log log N d) respectively. The behavior of the minimum eigenvalue is considered by studying the behavior of the maximum eigenvalue of the inverse matrix. In particular, we prove that the minimum eigenvalue λ 1 is shown to be at most O(exp(-√NW N*)) where W N* is a positive random variable converging weakly to a random variable constructed from a realization of the Brownian Bridge on [0, 2π). Additional results for (V*V) -1, a trace log formula for V*V, as well as a some numerical examinations of the size of the atom at 0 for the random Vandermonde eigenvalue distribution are also presented.
Original language | English |
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Title of host publication | 2011 49th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2011 |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 1816-1823 |
Number of pages | 8 |
ISBN (Electronic) | 9781457718168, 9781457718182 |
ISBN (Print) | 9781457718175 |
DOIs | |
Publication status | Published - 2011 |
Externally published | Yes |
Event | 2011 49th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2011 - Monticello, IL, United States Duration: 28 Sept 2011 → 30 Sept 2011 |
Other
Other | 2011 49th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2011 |
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Country/Territory | United States |
City | Monticello, IL |
Period | 28/09/11 → 30/09/11 |