Abstract
Atomic force microscopy has been used to image the surface structure of a range of gibbsite (Al(OH)3) crystals. A variety of microtopographies has been imaged on the (001) plane, and sub-nanometer detail has been observed on flat areas that is commensurate with the known bulk structure of the solid.
Original language | English |
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Pages (from-to) | 178-182 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 135 |
Issue number | 1-4 |
Publication status | Published - Sept 1998 |
Keywords
- Atomic force microscopy
- Gibbsite
- Surface structure