Atomic force microscopy of gibbsite

S. Lloyd, S. M. Thurgate, R. M. Cornell, G. M. Parkinson*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    16 Citations (Scopus)


    Atomic force microscopy has been used to image the surface structure of a range of gibbsite (Al(OH)3) crystals. A variety of microtopographies has been imaged on the (001) plane, and sub-nanometer detail has been observed on flat areas that is commensurate with the known bulk structure of the solid.

    Original languageEnglish
    Pages (from-to)178-182
    Number of pages5
    JournalApplied Surface Science
    Issue number1-4
    Publication statusPublished - Sept 1998


    • Atomic force microscopy
    • Gibbsite
    • Surface structure


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