Atomic layer deposition of thin films of ZnSe - Structural and optical characterization

E. Guziewicz*, M. Godlewski, K. Kopalko, E. Łusakowska, E. Dynowska, M. Guziewicz, M. M. Godlewski, M. Phillips

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    50 Citations (Scopus)

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