Axioms for information leakage

Mário S. Alvim*, Konstantinos Chatzikokolakis, Annabelle McIver, Carroll Morgan, Catuscia Palamidessi, Geoffrey Smith

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

24 Citations (Scopus)

Abstract

Quantitative information flow aims to assess and control the leakage of sensitive information by computer systems. A key insight in this area is that no single leakage measure is appropriate in all operational scenarios, as a result, many leakage measures have been proposed, with many different properties. To clarify this complex situation, this paper studies information leakage axiomatically, showing important dependencies among different axioms. It also establishes a completeness result about the g-leakage family, showing that any leakage measure satisfying certain intuitively-reasonable properties can be expressed as a g-leakage.

Original languageEnglish
Title of host publicationProceedings - IEEE 29th Computer Security Foundations Symposium, CSF 2016
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages77-92
Number of pages16
Volume2016-August
ISBN (Electronic)9781509026074
DOIs
Publication statusPublished - 8 Aug 2016
Event29th IEEE Computer Security Foundations Symposium, CSF 2016 - Lisbon, Portugal
Duration: 27 Jun 20161 Jul 2016

Publication series

NameIEEE Computer Security Foundations Symposium Proceedings
PublisherIEEE Computer Society
ISSN (Print)1940-1434

Other

Other29th IEEE Computer Security Foundations Symposium, CSF 2016
CountryPortugal
CityLisbon
Period27/06/161/07/16

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  • Cite this

    Alvim, M. S., Chatzikokolakis, K., McIver, A., Morgan, C., Palamidessi, C., & Smith, G. (2016). Axioms for information leakage. In Proceedings - IEEE 29th Computer Security Foundations Symposium, CSF 2016 (Vol. 2016-August, pp. 77-92). [7536368] (IEEE Computer Security Foundations Symposium Proceedings). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CSF.2016.13