Birefringence and piezo-Raman analysis of single crystal CVD diamond and effects on Raman laser performance

Hadiya Jasbeer*, Robert J. Williams, Ondrej Kitzler, Aaron McKay, Soumya Sarang, Jipeng Lin, Richard P. Mildren

*Corresponding author for this work

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Defect-induced stress has been mapped in optical-grade synthetic diamond (chemical vapor deposition grown, low nitrogen, low birefringence) using Metripol polarimetry, Mueller polarimetry, and Raman microscopy. Large circular retardance was observed in the 8 mm long h110i cut crystal with values up to 28° for some paths along the major axis. Metripol-determined values for linear birefringence magnitude and fast-Axis direction in such regions have significant error. Stress-induced shifts in Raman frequency were observed up to 0.7 cm-1, which we deduce result from uniaxial and biaxial stresses up to 0.86 GPa. We also elucidate the effect of stress on diamond Raman laser performance. For high cavity Q Raman lasers, the direction of the linear birefringence axis is found to be a primary factor determining the laser threshold and the input-output polarization characteristics.

Original languageEnglish
Pages (from-to)B56-B64
Number of pages9
JournalJournal of the Optical Society of America B: Optical Physics
Volume33
Issue number3
DOIs
Publication statusPublished - 1 Mar 2016

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