Abstract
This paper introduces a novel approach, using the critical planes tool and noninvertible map theory, to analyze the boundaries of attraction areas for the integrator outputs of third-order sigma-delta modulators. This allows estimation of the clipping level of the modulators and determination of the required on-chip area for switched-capacitors in the implementation of these modulators. This approach is also very flexible and may be applied to the design and implementation of a range of sigma-delta modulator architectures.
Original language | English |
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Title of host publication | 2004 International Conference on Communications, Circuits and Systems, ICCCAS 2004 |
Place of Publication | Piscataway, NJ; Chengdu; China |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 1377-1381 |
Number of pages | 5 |
Volume | 2 |
ISBN (Print) | 0780386477, 9780780386471 |
Publication status | Published - 2004 |
Event | 2004 International Conference on Communications, Circuits and Systems - Chengdu, China Duration: 27 Jun 2004 → 29 Jun 2004 |
Other
Other | 2004 International Conference on Communications, Circuits and Systems |
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Country/Territory | China |
City | Chengdu |
Period | 27/06/04 → 29/06/04 |
Keywords
- Absorbing boundary
- Critical planes
- Noninvertible map
- Sigma-delta modulator