Bounding attraction areas of a third-order sigma-delta modulator

J. Zhang*, P. V. Brennan, P. D. Smith, E. Vinogradova

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

    3 Citations (Scopus)

    Abstract

    This paper introduces a novel approach, using the critical planes tool and noninvertible map theory, to analyze the boundaries of attraction areas for the integrator outputs of third-order sigma-delta modulators. This allows estimation of the clipping level of the modulators and determination of the required on-chip area for switched-capacitors in the implementation of these modulators. This approach is also very flexible and may be applied to the design and implementation of a range of sigma-delta modulator architectures.

    Original languageEnglish
    Title of host publication2004 International Conference on Communications, Circuits and Systems, ICCCAS 2004
    Place of PublicationPiscataway, NJ; Chengdu; China
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    Pages1377-1381
    Number of pages5
    Volume2
    ISBN (Print)0780386477, 9780780386471
    Publication statusPublished - 2004
    Event2004 International Conference on Communications, Circuits and Systems - Chengdu, China
    Duration: 27 Jun 200429 Jun 2004

    Other

    Other2004 International Conference on Communications, Circuits and Systems
    CountryChina
    CityChengdu
    Period27/06/0429/06/04

    Keywords

    • Absorbing boundary
    • Critical planes
    • Noninvertible map
    • Sigma-delta modulator

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  • Cite this

    Zhang, J., Brennan, P. V., Smith, P. D., & Vinogradova, E. (2004). Bounding attraction areas of a third-order sigma-delta modulator. In 2004 International Conference on Communications, Circuits and Systems, ICCCAS 2004 (Vol. 2, pp. 1377-1381). Piscataway, NJ; Chengdu; China: Institute of Electrical and Electronics Engineers (IEEE).