TY - JOUR
T1 - Broad-band characterization of FET self-heating
AU - Parker, Anthony Edward
AU - Rathmell, James Grantley
N1 - Copyright 2006 IEEE. Reprinted from IEEE transactions on microwave theory and techniques. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
PY - 2005/7
Y1 - 2005/7
N2 - The temperature response of field-effect transistors to instantaneous power dissipation has been shown to be significant at high frequencies, even though the self-heating process has a very low time constant. This affects intermodulation at high frequencies, which is examined with the aid of a signal-flow description of the self-heating process. The impact on broad-band intermodulation is confirmed with measurements over a range of biases. Intermodulation measurements are then used to obtain parameters that describe the heating response in the frequency domain. This description is then implemented in a time-domain model suitable for transient analysis and compared with measured heating and cooling step responses.
AB - The temperature response of field-effect transistors to instantaneous power dissipation has been shown to be significant at high frequencies, even though the self-heating process has a very low time constant. This affects intermodulation at high frequencies, which is examined with the aid of a signal-flow description of the self-heating process. The impact on broad-band intermodulation is confirmed with measurements over a range of biases. Intermodulation measurements are then used to obtain parameters that describe the heating response in the frequency domain. This description is then implemented in a time-domain model suitable for transient analysis and compared with measured heating and cooling step responses.
UR - http://www.scopus.com/inward/record.url?scp=23144448855&partnerID=8YFLogxK
U2 - 10.1109/TMTT.2005.850399
DO - 10.1109/TMTT.2005.850399
M3 - Article
AN - SCOPUS:23144448855
VL - 53
SP - 2424
EP - 2429
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
SN - 0018-9480
IS - 7
ER -