CAD models of dispersion and losses for multilayer coplanar waveguide

Payal Majumdar, A. K. Verma

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

We present the closed-form models of conductor thickness dependent dispersive line parameters and losses, of multilayer CPW on isotropic dielectric substrates. The partial capacitance technique has been used for conformal mapping of the multilayered CPW structure. The dispersive empirical expressions for the single-layer CPW from literature are improved to include the finite conductivity and finite conductor thickness in propagation characteristics and losses. The single layer reduction formulation of lossy multilayer CPW is then used to extend the closed-form models developed for computation of line parameters, to multilayer structures. All developed models are verified against the results obtained using the EM-simulators for frequency range 1 GHz - 60 GHz over wide range of parameters. The average deviation of the model against the comparison is 3.5 %.

Original languageEnglish
Title of host publication2016 Asia-Pacific Microwave Conference (APMC2016)
Subtitle of host publicationproceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-4
Number of pages4
ISBN (Electronic)9781509015924
ISBN (Print)9781509015931
DOIs
Publication statusPublished - 2016
Event2016 Asia-Pacific Microwave Conference, APMC2016 - Aerocity, New Delhi, India
Duration: 5 Dec 20169 Dec 2016

Other

Other2016 Asia-Pacific Microwave Conference, APMC2016
CountryIndia
CityAerocity, New Delhi
Period5/12/169/12/16

Fingerprint Dive into the research topics of 'CAD models of dispersion and losses for multilayer coplanar waveguide'. Together they form a unique fingerprint.

Cite this