Skip to main navigation Skip to search Skip to main content

Can AI see what we can’t? Leveraging deep learning and multi-temporal satellite data to revolutionize crop type mapping and yield prediction

Gautam Siddharth Kashyap, Harsh Joshi, Manaswi Kulahara, Rajkumar Dhakar, Atul Sajjanhar, Jiechao Gao*, Sarthak Jain, Shahab Saquib Sohail

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

Precise mapping of crop types and estimating yields are important in gauging agricultural diversity and yield potential, especially in regions dominated by small-scale farming. Nevertheless, these tasks are challenging due to factors such as small field sizes, inter-cropping, and a lack of sufficient ground truth labels for certain regions. In this paper, we propose an approach that combines advanced deep learning algorithms with Sentinel-2 and MODIS satellite data for improving the accuracy of crop type mapping and yield prediction. We used datasets from the main growing season of 2017 in Kenya (Bungoma, Busia and Siaya) coupled with county level yield data from US, Argentina and Brazil spanning from 2005 to 2016. Our models (CNN, SegNet, MaskRCNN, ResNet, UNet) were evaluated on both tasks i.e., classification of crop types and predicting yields.

Original languageEnglish
Title of host publication2025 IEEE International Conference on Acoustics, Speech, and Signal Processing
Subtitle of host publicationConference Proceedings
Place of PublicationIndia
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages5
ISBN (Electronic)9798350368741
DOIs
Publication statusPublished - 7 Mar 2025
Externally publishedYes
Event2025 IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP 2025 - Hyderabad, India
Duration: 6 Apr 2025 → 11 Apr 2025

Conference

Conference2025 IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP 2025
Country/TerritoryIndia
CityHyderabad
Period6/04/25 → 11/04/25

Bibliographical note

Publisher Copyright:
©2025 IEEE.

Keywords

  • Agricultural
  • Crop Types
  • Deep Learning
  • Machine Learning
  • Yield

Fingerprint

Dive into the research topics of 'Can AI see what we can’t? Leveraging deep learning and multi-temporal satellite data to revolutionize crop type mapping and yield prediction'. Together they form a unique fingerprint.

Cite this