Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy

D. Little; P. Dekker; A. Rahmani; J. Dawes; G. Marshall; M. Withford

doi:10.1117/12.761087

Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy

D. Little^*, P. Dekker, A. Rahmani, J. Dawes, G. Marshall, M. Withford

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

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Abstract

We have performed measurements using a purpose-built Near-field Scanning Optical Microscope and shown that waveguides written with a fs laser in the kHz regime have an asymmetry associated with the unidirectional nature of the writing beam. Further, the asymmetry becomes more pronounced with increasing pulse energy. At very high pulse energies (5-10 J) the presence of multiple guided regions was also observed, indicating that the refractive index profile of the waveguide possesses several maxima, a result which is consistent with current studies on the filamentation process that high-powered laser pulses experience in a dielectric medium. In this paper we will present these observations, their subsequent: analysis and implications for photonic device fabrication using this method.

Original language	English
Title of host publication	Photonics: Design, Technology, and Packaging III
Editors	Wieslaw Z. Krolikowski, Costas M. Soukoulis, Ping Koy Lam, Timothy J. Davis, Shanhui Fan, Yuri S. Kivshar
Place of Publication	Bellingham, WA
Publisher	SPIE
Pages	1-9
Number of pages	9
Volume	6801
ISBN (Print)	9780819469724, 0819469726
DOIs	https://doi.org/10.1117/12.761087
Publication status	Published - 2008
Event	Photonics: Design, Technology, and Packaging III - Canberra, Australia Duration: 5 Dec 2007 → 7 Dec 2007

Other

Other	Photonics: Design, Technology, and Packaging III
Country	Australia
City	Canberra
Period	5/12/07 → 7/12/07

Bibliographical note

Copyright 2008 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

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Little, D., Dekker, P., Rahmani, A., Dawes, J., Marshall, G., & Withford, M. (2008). Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy. In W. Z. Krolikowski, C. M. Soukoulis, P. K. Lam, T. J. Davis, S. Fan, & Y. S. Kivshar (Eds.), Photonics: Design, Technology, and Packaging III (Vol. 6801, pp. 1-9). [680119] Bellingham, WA: SPIE. https://doi.org/10.1117/12.761087

Little, D. ; Dekker, P. ; Rahmani, A. ; Dawes, J. ; Marshall, G. ; Withford, M. / Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy. Photonics: Design, Technology, and Packaging III. editor / Wieslaw Z. Krolikowski ; Costas M. Soukoulis ; Ping Koy Lam ; Timothy J. Davis ; Shanhui Fan ; Yuri S. Kivshar. Vol. 6801 Bellingham, WA : SPIE, 2008. pp. 1-9

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abstract = "We have performed measurements using a purpose-built Near-field Scanning Optical Microscope and shown that waveguides written with a fs laser in the kHz regime have an asymmetry associated with the unidirectional nature of the writing beam. Further, the asymmetry becomes more pronounced with increasing pulse energy. At very high pulse energies (5-10 J) the presence of multiple guided regions was also observed, indicating that the refractive index profile of the waveguide possesses several maxima, a result which is consistent with current studies on the filamentation process that high-powered laser pulses experience in a dielectric medium. In this paper we will present these observations, their subsequent: analysis and implications for photonic device fabrication using this method.",

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Little, D , Dekker, P, Rahmani, A, Dawes, J, Marshall, G & Withford, M 2008, Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy. in WZ Krolikowski, CM Soukoulis, PK Lam, TJ Davis, S Fan & YS Kivshar (eds), Photonics: Design, Technology, and Packaging III. vol. 6801, 680119, SPIE, Bellingham, WA, pp. 1-9, Photonics: Design, Technology, and Packaging III, Canberra, Australia, 5/12/07. https://doi.org/10.1117/12.761087

Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy. / Little, D.; Dekker, P.; Rahmani, A.; Dawes, J.; Marshall, G.; Withford, M.

Photonics: Design, Technology, and Packaging III. ed. / Wieslaw Z. Krolikowski; Costas M. Soukoulis; Ping Koy Lam; Timothy J. Davis; Shanhui Fan; Yuri S. Kivshar. Vol. 6801 Bellingham, WA : SPIE, 2008. p. 1-9 680119.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

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N2 - We have performed measurements using a purpose-built Near-field Scanning Optical Microscope and shown that waveguides written with a fs laser in the kHz regime have an asymmetry associated with the unidirectional nature of the writing beam. Further, the asymmetry becomes more pronounced with increasing pulse energy. At very high pulse energies (5-10 J) the presence of multiple guided regions was also observed, indicating that the refractive index profile of the waveguide possesses several maxima, a result which is consistent with current studies on the filamentation process that high-powered laser pulses experience in a dielectric medium. In this paper we will present these observations, their subsequent: analysis and implications for photonic device fabrication using this method.

AB - We have performed measurements using a purpose-built Near-field Scanning Optical Microscope and shown that waveguides written with a fs laser in the kHz regime have an asymmetry associated with the unidirectional nature of the writing beam. Further, the asymmetry becomes more pronounced with increasing pulse energy. At very high pulse energies (5-10 J) the presence of multiple guided regions was also observed, indicating that the refractive index profile of the waveguide possesses several maxima, a result which is consistent with current studies on the filamentation process that high-powered laser pulses experience in a dielectric medium. In this paper we will present these observations, their subsequent: analysis and implications for photonic device fabrication using this method.

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Little D , Dekker P, Rahmani A, Dawes J, Marshall G, Withford M. Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy. In Krolikowski WZ, Soukoulis CM, Lam PK, Davis TJ, Fan S, Kivshar YS, editors, Photonics: Design, Technology, and Packaging III. Vol. 6801. Bellingham, WA: SPIE. 2008. p. 1-9. 680119 https://doi.org/10.1117/12.761087