Characterising different types of flattened-Gaussian beams using M2, K, and L

Saiedeh Saghafi, G.W. Forbes

Research output: Contribution to conferenceAbstract

Original languageEnglish
Pages951-951
Number of pages1
Publication statusPublished - 2000
EventProgress In Electromagnetics Research Symposium - Cambridge, USA, United States
Duration: 5 Jul 200014 Jul 2000

Conference

ConferenceProgress In Electromagnetics Research Symposium
CountryUnited States
CityCambridge, USA
Period5/07/0014/07/00

Cite this

Saghafi, S., & Forbes, G. W. (2000). Characterising different types of flattened-Gaussian beams using M2, K, and L. 951-951. Abstract from Progress In Electromagnetics Research Symposium, Cambridge, USA, United States.