Characterising Different Types of Flattened Gaussian Beams Using M2, k, L

Saiedeh Saghafi, G.W. Forbes

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    Original languageEnglish
    Title of host publicationPIERS 2000 Proceedings
    Place of PublicationBoston, USA
    PublisherElectromagnetics Academy
    Number of pages1
    ISBN (Print)0967967406
    Publication statusPublished - 2000
    EventProgress In Electromagnetics Research Symposium - Cambridge, USA, United States
    Duration: 5 Jul 200014 Jul 2000


    ConferenceProgress In Electromagnetics Research Symposium
    Country/TerritoryUnited States
    CityCambridge, USA

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