Characterising Different Types of Flattened Gaussian Beams Using M2, k, L

Saiedeh Saghafi, G.W. Forbes

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Original languageEnglish
Title of host publicationPIERS 2000 Proceedings
Place of PublicationBoston, USA
PublisherElectromagnetics Academy
Number of pages1
ISBN (Print)0967967406
Publication statusPublished - 2000
EventProgress In Electromagnetics Research Symposium - Cambridge, USA, United States
Duration: 5 Jul 200014 Jul 2000


ConferenceProgress In Electromagnetics Research Symposium
CountryUnited States
CityCambridge, USA

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