Characterising Different Types of Flattened Gaussian Beams Using M2, k, L

Saiedeh Saghafi, G.W. Forbes

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Original language	English
Title of host publication	PIERS 2000 Proceedings
Place of Publication	Boston, USA
Publisher	Electromagnetics Academy
Pages	951-951
Number of pages	1
ISBN (Print)	0967967406
Publication status	Published - 2000
Event	Progress In Electromagnetics Research Symposium - Cambridge, USA, United States Duration: 5 Jul 2000 → 14 Jul 2000

Conference	Progress In Electromagnetics Research Symposium
Country/Territory	United States
City	Cambridge, USA
Period	5/07/00 → 14/07/00

Cite this

@inproceedings{31eb782a162f4d87a5b55bb994a9ae0d,

title = "Characterising Different Types of Flattened Gaussian Beams Using M2, k, L",

author = "Saiedeh Saghafi and G.W. Forbes",

year = "2000",

language = "English",

isbn = "0967967406",

pages = "951--951",

booktitle = "PIERS 2000 Proceedings",

publisher = "Electromagnetics Academy",

address = "United States",

note = "Progress In Electromagnetics Research Symposium ; Conference date: 05-07-2000 Through 14-07-2000",

}

TY - GEN

T1 - Characterising Different Types of Flattened Gaussian Beams Using M2, k, L

AU - Saghafi, Saiedeh

AU - Forbes, G.W.

PY - 2000

Y1 - 2000

M3 - Conference proceeding contribution

SN - 0967967406

SP - 951

EP - 951

BT - PIERS 2000 Proceedings

PB - Electromagnetics Academy

CY - Boston, USA

T2 - Progress In Electromagnetics Research Symposium

Y2 - 5 July 2000 through 14 July 2000

ER -