Characterising microwave transistor dynamics with small-signal measurements

Anthony E. Parker, James G. Rathmell

    Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

    Abstract

    Small-signal microwave transistor characteristics are used to construct and fit a comprehensive model of their dynamic behaviour. The model includes thermal effects and trap-related effects, which influences such a large range of frequencies that they are not well characterized by large-signal or pulse measurements alone. Correlation of the model with smallsignal characteristics demonstrates the region of influence of specific dynamic effects. The model extrapolates beyond the measurement space to quantify the very significant impact that transistor dispersion has on microwave circuit performance. The results question the adequacy of conventional transistor characterization techniques for accurate circuit design.
    Original languageEnglish
    Title of host publicationProceedings of the WARS2006 Conference
    EditorsPhil Wilkinson
    Place of PublicationCanberra
    PublisherNational Committee Radio Service
    Number of pages10
    ISBN (Print)0643093184
    Publication statusPublished - 2006
    EventWorkshop on the Applications of Radio Science (6th : 2006) - Leura, NSW
    Duration: 15 Feb 200617 Feb 2006

    Workshop

    WorkshopWorkshop on the Applications of Radio Science (6th : 2006)
    CityLeura, NSW
    Period15/02/0617/02/06

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