Characterising microwave transistor dynamics with small-signal measurements

Anthony E. Parker, James G. Rathmell

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

Small-signal microwave transistor characteristics are used to construct and fit a comprehensive model of their dynamic behaviour. The model includes thermal effects and trap-related effects, which influences such a large range of frequencies that they are not well characterized by large-signal or pulse measurements alone. Correlation of the model with smallsignal characteristics demonstrates the region of influence of specific dynamic effects. The model extrapolates beyond the measurement space to quantify the very significant impact that transistor dispersion has on microwave circuit performance. The results question the adequacy of conventional transistor characterization techniques for accurate circuit design.
Original languageEnglish
Title of host publicationProceedings of the WARS2006 Conference
EditorsPhil Wilkinson
Place of PublicationCanberra
PublisherNational Committee Radio Service
Number of pages10
ISBN (Print)0643093184
Publication statusPublished - 2006
EventWorkshop on the Applications of Radio Science (6th : 2006) - Leura, NSW
Duration: 15 Feb 200617 Feb 2006

Workshop

WorkshopWorkshop on the Applications of Radio Science (6th : 2006)
CityLeura, NSW
Period15/02/0617/02/06

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  • Cite this

    Parker, A. E., & Rathmell, J. G. (2006). Characterising microwave transistor dynamics with small-signal measurements. In P. Wilkinson (Ed.), Proceedings of the WARS2006 Conference Canberra: National Committee Radio Service.