Characterization of experimental textured ZnO: Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc

David N. R. Payne; Stuart A. Boden; Owain D. Clark; Alan E. Delahoy; Darren M. Bagnall

doi:10.1109/PVSC.2010.5617012

Characterization of experimental textured ZnO

Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc

David N. R. Payne, Stuart A. Boden, Owain D. Clark, Alan E. Delahoy, Darren M. Bagnall

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

Abstract

We present the comprehensive characterization of several experimental ZnO:Al films for thin film solar cell applications. The morphological and optical properties of these films are determined using traditional and new, experimental measurement techniques and results are compared to those of the commercial Asahi U-type TCO as well as samples of planar TCOs coated in silver nanoparticles. Results show that the textured ZnO:Al films provide far superior scattering to the commercial alternatives studied. Nanoparticle coated planar TCOs also show scattering enhancement with results suggesting that nanoparticle layers could be tuned to predominantly scatter light within a chosen wavelength range.

Original language	English
Title of host publication	35th IEEE Photovoltaic Specialists Conference
Subtitle of host publication	conference proceedings
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1560-1564
Number of pages	5
ISBN (Electronic)	9781424458912, 9781424458929
ISBN (Print)	9781424458905
DOIs	https://doi.org/10.1109/PVSC.2010.5617012
Publication status	Published - 2010
Externally published	Yes
Event	35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country	United States
City	Honolulu, HI
Period	20/06/10 → 25/06/10

Access to Document

10.1109/PVSC.2010.5617012

Link to publication in Scopus

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Payne, D. N. R., Boden, S. A., Clark, O. D., Delahoy, A. E., & Bagnall, D. M. (2010). Characterization of experimental textured ZnO: Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc. In 35th IEEE Photovoltaic Specialists Conference: conference proceedings (pp. 1560-1564). [5617012] Piscataway: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PVSC.2010.5617012

Payne, David N. R. ; Boden, Stuart A. ; Clark, Owain D. ; Delahoy, Alan E. ; Bagnall, Darren M. / Characterization of experimental textured ZnO : Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc. 35th IEEE Photovoltaic Specialists Conference: conference proceedings. Piscataway : Institute of Electrical and Electronics Engineers (IEEE), 2010. pp. 1560-1564

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title = "Characterization of experimental textured ZnO: Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc",

abstract = "We present the comprehensive characterization of several experimental ZnO:Al films for thin film solar cell applications. The morphological and optical properties of these films are determined using traditional and new, experimental measurement techniques and results are compared to those of the commercial Asahi U-type TCO as well as samples of planar TCOs coated in silver nanoparticles. Results show that the textured ZnO:Al films provide far superior scattering to the commercial alternatives studied. Nanoparticle coated planar TCOs also show scattering enhancement with results suggesting that nanoparticle layers could be tuned to predominantly scatter light within a chosen wavelength range.",

author = "Payne, {David N. R.} and Boden, {Stuart A.} and Clark, {Owain D.} and Delahoy, {Alan E.} and Bagnall, {Darren M.}",

year = "2010",

doi = "10.1109/PVSC.2010.5617012",

language = "English",

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Payne, DNR, Boden, SA, Clark, OD, Delahoy, AE & Bagnall, DM 2010, Characterization of experimental textured ZnO: Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc. in 35th IEEE Photovoltaic Specialists Conference: conference proceedings., 5617012, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, pp. 1560-1564, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 20/06/10. https://doi.org/10.1109/PVSC.2010.5617012

Characterization of experimental textured ZnO : Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc. / Payne, David N. R.; Boden, Stuart A.; Clark, Owain D.; Delahoy, Alan E.; Bagnall, Darren M.

35th IEEE Photovoltaic Specialists Conference: conference proceedings. Piscataway : Institute of Electrical and Electronics Engineers (IEEE), 2010. p. 1560-1564 5617012.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

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AB - We present the comprehensive characterization of several experimental ZnO:Al films for thin film solar cell applications. The morphological and optical properties of these films are determined using traditional and new, experimental measurement techniques and results are compared to those of the commercial Asahi U-type TCO as well as samples of planar TCOs coated in silver nanoparticles. Results show that the textured ZnO:Al films provide far superior scattering to the commercial alternatives studied. Nanoparticle coated planar TCOs also show scattering enhancement with results suggesting that nanoparticle layers could be tuned to predominantly scatter light within a chosen wavelength range.

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Payne DNR, Boden SA, Clark OD, Delahoy AE, Bagnall DM. Characterization of experimental textured ZnO: Al films for thin film solar cell applications and comparison with commercial and plasmonic alternativesc. In 35th IEEE Photovoltaic Specialists Conference: conference proceedings. Piscataway: Institute of Electrical and Electronics Engineers (IEEE). 2010. p. 1560-1564. 5617012 https://doi.org/10.1109/PVSC.2010.5617012